Optical diffusing films and methods of making same

ABSTRACT

Optical diffusing films are made by microreplication from a structured surface tool. The tool is made using a 2-part electroplating process, wherein a first electroplating procedure forms a first metal layer with a first major surface, and a second electroplating procedure forms a second metal layer on the first metal layer, the second metal layer having a second major surface with a smaller average roughness than that of the first major surface. The second major surface can function as the structured surface of the tool. A replica of this surface can then be made in a major surface of an optical film to provide light diffusing properties. The structured surface and/or its constituent structures can be characterized in terms of various parameters such as optical haze, optical clarity, Fourier power spectra of the topography along orthogonal in-plane directions, ridge length per unit area, equivalent circular diameter (ECD), and/or aspect ratio.

FIELD OF THE INVENTION

This invention relates generally to optical films, with particularapplication to such films that can be made by microreplication from atool, and where the tool may be readily tailored to provide the filmwith a controlled amount of optical diffusion and optical clarity withexceptional spatial uniformity.

BACKGROUND

Display systems, such as liquid crystal display (LCD) systems, are usedin a variety of applications and commercially available devices such as,for example, computer monitors, personal digital assistants (PDAs),mobile phones, miniature music players, and thin LCD televisions. ManyLCDs include a liquid crystal panel and an extended area light source,often referred to as a backlight, for illuminating the liquid crystalpanel. Backlights typically include one or more lamps and a number oflight management films such as, for example, light guides, mirror films,light redirecting films (including brightness enhancement films),retarder films, light polarizing films, and diffusing films. Diffusingfilms are typically included to hide optical defects and improve thebrightness uniformity of the light emitted by the backlight. Diffusingfilms can also be used in applications other than display systems.

DISCUSSION

Some diffusing films use a beaded construction to provide the lightdiffusion. For example, an optical film may have a layer of microscopicbeads adhered to one surface of the film, and the refraction of light atthe bead surfaces may operate to provide the light diffusioncharacteristics of the film. Examples of beaded diffusing films include:a linear prismatic brightness enhancement film with a matte surface ofsparsely distributed beads, sold under the product designation TBEF2-GMby 3M Company, referred to herein as a “sparsely distributed beadeddiffuser” or “SDB diffuser”; a reflective polarizing film with a beadeddiffuser layer, sold under the product designation DBEF-D3-340 by 3MCompany, referred to herein as a “densely-packed beaded diffuser” or“DPB diffuser”; and a diffusing cover sheet included in a commercialdisplay device, referred to herein as a “commercial cover sheetdiffuser” or “CCS diffuser”. FIG. 1 shows a scanning electron microscope(SEM) image of a representative portion of the beaded surface of a CCSdiffuser, and FIG. 1A shows an SEM image of such surface incross-section. FIGS. 2 and 3 show SEM images of representative portionsof a DPB diffuser and a SDB diffuser, respectively.

Other diffusing films use a structured surface other than a beaded layerto provide the light diffusion, where the structured surface is made bymicroreplication from a structured tool. Examples of such diffusingfilms include: films (referred to herein as “Type I Microreplicated”diffusing films) with rounded or curved structures microreplicated froma tool having corresponding structures made by removing material fromthe tool with a cutter, as described in US 2012/0113622 (Aronson etal.), US 2012/0147593 (Yapel et al.), WO 2011/056475 (Barbie), and WO2012/0141261 (Aronson et al.); and films (referred to herein at “Type IIMicroreplicated” diffusing films) with flat-faceted structuresmicroreplicated from a tool having corresponding structures made by anelectroplating process, as described in US 2010/0302479 (Aronson etal.). An SEM image of a representative portion of the structured surfaceof a Type I Microreplicated diffusing film is shown in FIG. 4, and asimilar image of a Type II Microreplicated diffusing film is shown inFIG. 5. Still other microreplicated diffusing films include films inwhich a tool surface is made to be structured by a sandblastingprocedure, and the structured surface is then imparted to the film bymicroreplication from the tool. See e.g. U.S. Pat. No. 7,480,097(Nagahama et al.).

BRIEF SUMMARY

In the case of diffusing films having beaded constructions, beads add tothe cost of manufacture. Beaded films are also susceptible to downweb,crossweb, and lot-to-lot variability. Furthermore, individual beads candislodge from the film, e.g. when cutting or converting the film intoindividual sheets, and the dislodged beads may cause unwanted abrasionin the system of which the diffusing film is a part, e.g. a display orbacklight. In the case of Type I Microreplicated diffusing films, thetime required to cut a tool of a given size increases rapidly as thefeature size of structures on the structured surface is decreased.Feature sizes averaging less than about 15 or 10 microns are desirablein order to avoid an optical artifact known as “sparkle” or granularitywhen the film is used in modern display systems, and the time requiredto cut a tool having such small feature sizes for Type I Microreplicateddiffusing films can become long or excessive, and can increasemanufacturing costs. Furthermore, the cutting approach can tend tointroduce a measureable in-plane spatial periodicity to the structuredsurface (even if the structures on the surface appear to be orientedrandomly), which may give rise to moire effects in display applications.In the case of Type II Microreplicated diffusing films, although themanufacturing process can be tailored to provide films with variouslevels of optical haze, the optical clarity of such films tends to berelatively high (e.g. in comparison to Type I Microreplicated diffusingfilms), which is sometimes considered disadvantageous because, for agiven amount of optical haze, a diffusing film with a higher opticalclarity does not hide defects as well as a similar film with a loweroptical clarity. This is shown schematically in the optical clarity vs.optical haze graph of FIG. 6, where region 610 represents very roughlyan approximate design space of Type I Microreplicated diffusing films,and region 612 represents very roughly an approximate design space ofType II Microreplicated diffusing films. (Optical haze and opticalclarity are discussed in more detail below.) In the case ofmicroreplicated diffusing films in which a structured surface is madeusing a sandblasting procedure, such films tend to have detectablespatial non-uniformities, e.g., patterns or artifacts that are theresult of the path taken by the sandblasting jet or nozzle as it scansacross the extended surface of the tool.

We have developed a family of optical diffusing films, and methods ofmaking such films, that can overcome one, some, or all of the foregoingdifficulties or challenges. The films can be made by fabricating a toolhaving a structured surface, and microreplicating the structured surfaceas a major surface of the optical film. Fabrication of the tool caninvolve electrodepositing a first layer of a metal under conditions thatproduce a first major surface with a relatively high average roughness,followed by covering up the first layer by electrodepositing a secondlayer of the same metal on the first layer, under conditions thatproduce a second major surface with a relatively lower averageroughness, i.e., lower than that of the first major surface. The secondmajor surface has a structured topography which, when replicated to forma structured major surface of an optical film, provides the film with adesired combination of optical haze and optical clarity, along withother characteristics related to the topography of the structuredsurface that can be advantageous when the film is combined with othercomponents in a display, e.g. for avoiding artifacts such as moire,sparkle, graininess, and/or other observable spatial patterns or marks.Before microreplication, the second major surface may be furthertreated, e.g., coated with a thin layer of a different metal such as forpurposes of passivation or protection, but such a coating is preferablythin enough to maintain substantially the same average roughness andtopography as the second major surface of the second layer. By formingthe structured surface using electrodeposition techniques rather thantechniques that require cutting of a substrate with a diamond tool orthe like, large area tool surfaces can be prepared in substantially lesstime and at reduced cost.

As already stated, the structured major surface of the optical filmprovides the film with a desired amount of optical haze and opticalclarity. The structured major surface also preferably has physicalproperties that avoid or diminish one or more of the artifacts mentionedabove. For example, the topography of the structured surface may possessa degree of irregularity or randomness in surface profile characterizedby an ultra-low periodicity, i.e., a substantial absence of anysignificant periodicity peaks in a Fourier spectrum as a function ofspatial frequency along each of a first and second orthogonal in-planedirection. Furthermore, the structured surface may comprise discerniblestructures, e.g. in the form of distinct cavities and/or protrusions,and the structures may be limited in size along two orthogonal in-planedirections. The size of a given structure may be expressed in terms ofan equivalent circular diameter (ECD) in plan view, and the structuresmay have an average ECD of less than 15 microns, or less than 10microns, or in a range from 4 to 10 microns, for example. In some cases,the structures may have a bimodal distribution of larger structures incombination with smaller structures. The structures may be closelypacked and irregularly or non-uniformly dispersed. In some cases, some,most, or substantially all of the structures may be curved or comprise arounded or otherwise curved base surface. In some cases, some of thestructures may be pyramidal in shape or otherwise defined bysubstantially flat facets. The structures can in at least some cases becharacterized by an aspect ratio of the depth or height of thestructures divided by a characteristic transverse dimension, e.g. theECD, of the structures. The structured surface may comprise ridges,which may for example be formed at the junctions of adjacentclosely-packed structures. In such cases, a plan view of the structuredsurface (or of a representative portion thereof) may be characterized interms of the total ridge length per unit area. The optical haze, opticalclarity, and other characteristics of the optical diffusing films can beprovided without the use of any beads at or on the structured surface,or elsewhere within the optical film.

The present application therefore discloses methods of making astructured surface. The methods include forming a first layer of a metalby electrodepositing the metal using a first electroplating processresulting in a first major surface of the first layer having a firstaverage roughness. The methods also include forming a second layer ofthe metal on the first major surface of the first layer byelectrodepositing the metal on the first major surface using a secondelectroplating process resulting in a second major surface of the secondlayer having a second average roughness smaller than the first averageroughness.

The first electroplating process may use a first electroplating solutionand the second electroplating process may use a second electroplatingsolution, and the second electroplating solution may differ from thefirst electroplating solution at least by the addition of an organicleveler and/or an organic grain refiner. The second electroplatingprocess may include thieving and/or shielding. The method may alsoinclude providing a base surface having a base average roughness, andthe first layer may be formed on the base surface, and the first averageroughness may be greater than the base average roughness. The metal maybe copper or other suitable metals. The first electroplating process mayuse a first electroplating solution that contains at most trace amountsof an organic leveler, for example, the first electroplating solutionmay have a total concentration of organic carbon less than 100, or 75,or 50 ppm. The first electroplating process may use a firstelectroplating solution and the second electroplating process may use asecond electroplating solution, and a ratio of a concentration of anorganic leveler in the second electroplating solution to a concentrationof any organic leveler in the first electroplating solution may be atleast 50, or 100, or 200, or 500. Forming the first layer may result inthe first major surface comprising a plurality of non-uniformly arrangedfirst structures, and the first structures may include flat facets.Forming the second layer may result in the second major surfacecomprising a plurality of non-uniformly arranged second structures. Themethod may also include forming a third layer of a second metal on thesecond major surface by electrodepositing the second metal using anelectroplating solution of the second metal. The second metal maycomprise chromium.

We also disclose microreplication tools made using such methods, suchthat the microreplication tool has a tool structured surfacecorresponding to the second major surface. The tool structured surfacemay correspond to an inverted form of the second major surface or anon-inverted form of the second major surface. The microreplication toolmay include the first layer of the metal, the second layer of the metal,and a third layer of a second metal formed on the second layer.

We also disclose optical films made using such microreplication tools,such that the film has a structured surface corresponding to the secondmajor surface. The structured surface of the film may correspond to aninverted form of the second major surface or a non-inverted form of thesecond major surface.

We also disclose optical films that include a structured major surfacecomprising closely-packed structures arranged such that ridges areformed between adjacent structures, the structures being limited in sizealong two orthogonal in-plane directions. The structured major surfacemay have a topography characterizable by a first and second Fourierpower spectrum associated with respective first and second orthogonalin-plane directions, and (a) to the extent the first Fourier powerspectrum includes one or more first frequency peak not corresponding tozero frequency and being bounded by two adjacent valleys that define afirst baseline, any such first frequency peak may have a first peakratio of less than 0.8, the first peak ratio being equal to an areabetween the first frequency peak and the first baseline divided by anarea beneath the first frequency peak, and (b) to the extent the secondFourier power spectrum includes one or more second frequency peak notcorresponding to zero frequency and being bounded by two adjacentvalleys that define a second baseline, any such second frequency peakmay have a second peak ratio of less than 0.8, the second peak ratiobeing equal to an area between the second frequency peak and the secondbaseline divided by an area beneath the second frequency peak. Thestructured major surface may be characterized by a total ridge lengthper unit area in plan view of less than 200 mm/mm², or less than 150mm/mm², or in a range from 10 to 150 mm/mm².

The first peak ratio may be less than 0.5 and the second peak ratio maybe less than 0.5. The structured major surface may provide an opticalhaze of at least 5% and less than 95%. The closely-packed structures maybe characterized by equivalent circular diameters (ECDs) in plan view,and the structures may have an average ECD of less than 15 microns, orless than 10 microns, or in a range from 4 to 10 microns. The structuredmajor surface may include substantially no beads. At least some, ormost, or substantially all of the closely-packed structures may comprisecurved base surfaces.

We also disclose optical films that include a structured major surfacecomprising closely-packed structures, the structured major surfacedefining a reference plane and a thickness direction perpendicular tothe reference plane. The structured major surface may have a topographycharacterizable by a first and second Fourier power spectrum associatedwith respective first and second orthogonal in-plane directions, and (a)to the extent the first Fourier power spectrum includes one or morefirst frequency peak not corresponding to zero frequency and beingbounded by two adjacent valleys that define a first baseline, any suchfirst frequency peak may have a first peak ratio of less than 0.8, thefirst peak ratio being equal to an area between the first frequency peakand the first baseline divided by an area beneath the first frequencypeak, and (b) to the extent the second Fourier power spectrum includesone or more second frequency peak not corresponding to zero frequencyand being bounded by two adjacent valleys that define a second baseline,any such second frequency peak may have a second peak ratio of less than0.8, the second peak ratio being equal to an area between the secondfrequency peak and the second baseline divided by an area beneath thesecond frequency peak. The closely-packed structures may becharacterized by equivalent circular diameters (ECDs) in the referenceplane and mean heights along the thickness direction, and an aspectratio of each structure may equal the mean height of the structuredivided by the ECD of the structure; and an average aspect ratio of thestructures may be less than 0.15.

The structured major surface may be characterized by a total ridgelength per unit area in plan view of less than 200 mm/mm², or less than150 mm/mm², or in a range from 10 to 150 mm/mm². The first peak ratiomay be less than 0.5 and the second peak ratio may be less than 0.5. Thestructured major surface may provide an optical haze of at least 5% andless than 95%. The closely-packed structures may be characterized byequivalent circular diameters (ECDs) in plan view, and the structuresmay have an average ECD of less than 15 microns, or less than 10microns, or in a range from 4 to 10 microns. The structured majorsurface may include substantially no beads. At least some, or most, orsubstantially all of the closely-packed structures may comprise curvedbase surfaces.

We also disclose optical films that include a structured major surfacecomprising closely-packed structures having curved base surfaces. Thestructured major surface may have a topography characterizable by afirst and second Fourier power spectrum associated with respective firstand second orthogonal in-plane directions, and (a) to the extent thefirst Fourier power spectrum includes one or more first frequency peaknot corresponding to zero frequency and being bounded by two adjacentvalleys that define a first baseline, any such first frequency peak mayhave a first peak ratio of less than 0.8, the first peak ratio beingequal to an area between the first frequency peak and the first baselinedivided by an area beneath the first frequency peak, and (b) to theextent the second Fourier power spectrum includes one or more secondfrequency peak not corresponding to zero frequency and being bounded bytwo adjacent valleys that define a second baseline, any such secondfrequency peak may have a second peak ratio of less than 0.8, the secondpeak ratio being equal to an area between the second frequency peak andthe second baseline divided by an area beneath the second frequencypeak. Furthermore, the structured major surface may provide an opticalhaze of less than 95%, or less than 90%, or less than 80%, or in a rangefrom 20 to 80%.

The structured major surface may be characterized by a total ridgelength per unit area in plan view of less than 200 mm/mm². The firstpeak ratio may be less than 0.5 and the second peak ratio may be lessthan 0.5. The closely-packed structures may be characterized byequivalent circular diameters (ECDs) in plan view, and the structuresmay have an average ECD of less than 15 microns, or less than 10microns, or in a range from 4 to 10 microns. The structured majorsurface may include substantially no beads.

We also disclose optical films that include a structured major surfacecomprising closely-packed structures. The structured major surface mayhave a topography characterizable by a first and second Fourier powerspectrum associated with respective first and second orthogonal in-planedirections, and (a) to the extent the first Fourier power spectrumincludes one or more first frequency peak not corresponding to zerofrequency and being bounded by two adjacent valleys that define a firstbaseline, any such first frequency peak may have a first peak ratio ofless than 0.8, the first peak ratio being equal to an area between thefirst frequency peak and the first baseline divided by an area beneaththe first frequency peak, and (b) to the extent the second Fourier powerspectrum includes one or more second frequency peak not corresponding tozero frequency and being bounded by two adjacent valleys that define asecond baseline, any such second frequency peak may have a second peakratio of less than 0.8, the second peak ratio being equal to an areabetween the second frequency peak and the second baseline divided by anarea beneath the second frequency peak. The structured major surface mayprovide an optical haze in a range from 10 to 60% and an optical clarityin a range from 10 to 40%, or an optical haze in a range from 20 to 60%and an optical clarity in a range from 10 to 40%, or an optical haze ina range from 20 to 30% and an optical clarity in a range from 15 to 40%.

The structured major surface may be characterized by a total ridgelength per unit area in plan view of less than 200 mm/mm². The firstpeak ratio may be less than 0.5 and the second peak ratio may be lessthan 0.5. The closely-packed structures may be characterized byequivalent circular diameters (ECDs) in plan view, and the structuresmay have an average ECD of less than 15 microns, or less than 10microns, or in a range from 4 to 10 microns. The structured majorsurface may include substantially no beads.

We also disclose optical films that include a structured major surfacecomprising larger first structures and smaller second structures, thefirst and second structures both being limited in size along twoorthogonal in-plane directions. The first structures may benon-uniformly arranged on the major surface, and the second structuresmay be closely packed and non-uniformly dispersed between the firststructures, and an average size of the first structures may be greaterthan 15 microns and an average size of the second structures may be lessthan 15 microns.

The average size of the first structures may be an average equivalentcircular diameter (ECD) of the first structures, and the average size ofthe second structures may be an average equivalent circular diameter(ECD) of the second structures. The average size of the first structuresmay be in a range from 20 to 30 microns. The average size of the secondstructures may be in a range from 4 to 10 microns. The structured majorsurface may have a topography characterizable by a first and secondFourier power spectrum associated with respective first and secondorthogonal in-plane directions, and (a) to the extent the first Fourierpower spectrum includes one or more first frequency peak notcorresponding to zero frequency and being bounded by two adjacentvalleys that define a first baseline, any such first frequency peak mayhave a first peak ratio of less than 0.8, the first peak ratio beingequal to an area between the first frequency peak and the first baselinedivided by an area beneath the first frequency peak, and (b) to theextent the second Fourier power spectrum includes one or more secondfrequency peak not corresponding to zero frequency and being bounded bytwo adjacent valleys that define a second baseline, any such secondfrequency peak may have a second peak ratio of less than 0.8, the secondpeak ratio being equal to an area between the second frequency peak andthe second baseline divided by an area beneath the second frequencypeak. The first ratio may be less than 0.5 and the second ratio may beless than 0.5. The first structures may be flat-faceted structures, andthe second structures may be curved structures. The first structures maybe first cavities in the major surface, and the second structures may besecond cavities in the major surface. The structured major surface maybe characterized by a bimodal distribution of equivalent circulardiameter (ECD) of structures of the structured surface, the bimodaldistribution having a first and second peak, the larger first structurescorresponding to the first peak and the smaller second structurescorresponding to the second peak. The structured major surface mayinclude substantially no beads.

We also disclose display systems that include a light guide, a displaypanel configured to be backlit by light from the light guide, one ormore prismatic brightness enhancement films disposed between the lightguide and the display panel, and a light diffusing film disposed betweenthe light guide and the one or more prismatic brightness enhancementfilms. The light diffusing film may have a haze of at least 80%, and thelight diffusing film may have a first structured major surface made bymicroreplication from a tool structured surface, the tool structuredsurface being made by forming a first layer of a metal byelectrodepositing the metal using a first electroplating processresulting in a major surface of the first layer having a first averageroughness, and forming a second layer of the metal on the major surfaceof the first layer by electrodepositing the metal on the first layerusing a second electroplating process resulting in a major surface ofthe second layer having a second average roughness smaller than thefirst average roughness, the major surface of the second layercorresponding to the tool structured surface.

The first structured major surface of the light diffusing film may havea topography characterizable by a first and second Fourier powerspectrum associated with respective first and second orthogonal in-planedirections, and (a) to the extent the first Fourier power spectrumincludes one or more first frequency peak not corresponding to zerofrequency and being bounded by two adjacent valleys that define a firstbaseline, any such first frequency peak may have a first peak ratio ofless than 0.8, the first peak ratio being equal to an area between thefirst frequency peak and the first baseline divided by an area beneaththe first frequency peak, and (b) to the extent the second Fourier powerspectrum includes one or more second frequency peak not corresponding tozero frequency and being bounded by two adjacent valleys that define asecond baseline, any such second frequency peak may have a second peakratio of less than 0.8, the second peak ratio being equal to an areabetween the second frequency peak and the second baseline divided by anarea beneath the second frequency peak. The first structured majorsurface of the light diffusing film may comprise closely-packedstructures arranged such that ridges are formed between adjacentstructures, the structures being limited in size along two orthogonalin-plane directions, and the first structured major surface may becharacterized by a total ridge length per unit area in plan view of lessthan 200 mm/mm². The first structured major surface of the lightdiffusing film may comprise closely-packed structures, the structuredmajor surface defining a reference plane and a thickness directionperpendicular to the reference plane, and the closely-packed structuresmay be characterized by equivalent circular diameters (ECDs) in thereference plane and mean heights along the thickness direction, and anaspect ratio of each structure may equal the mean height of thestructure divided by the ECD of the structure; and an average aspectratio of the structures may be less than 0.15.

The first structured major surface of the light diffusing film maycomprise closely-packed structures having curved base surfaces, and thefirst structured major surface may provide an optical haze of less than95%. The first structured major surface of the light diffusing film maycomprise larger first structures and smaller second structures, thefirst and second structures both being limited in size along twoorthogonal in-plane directions; and the first structures may benon-uniformly arranged on the first structured major surface; the secondstructures may be closely packed and non-uniformly dispersed between thefirst structures; and an average size of the first structures may begreater than 15 microns and an average size of the second structures maybe less than 15 microns. The light diffusing film may have a secondstructured major surface opposite the first structured major surface,the second structured major surface made by microreplication from asecond tool structured surface, the second tool structured surface beingmade by forming a third layer of the metal by electrodepositing themetal using a third electroplating process resulting in a major surfaceof the third layer having a third average roughness, and forming afourth layer of the metal on the major surface of the third layer byelectrodepositing the metal on the third layer using a fourthelectroplating process resulting in a major surface of the fourth layerhaving a fourth average roughness smaller than the third averageroughness, the major surface of the fourth layer corresponding to thesecond tool structured surface. The first structured major surface ofthe diffusing film may face the display panel and the second structuredmajor surface of the diffusing film may face the light guide, and thefirst structured major surface may be associated with a first haze andthe second structured major surface may be associated with a secondhaze, and the first haze may be greater than the second haze.

We also disclose optical films that include a first structured majorsurface opposite a second structured major surface, the first structuredmajor surface being made by microreplication from a first toolstructured surface, the first tool structured surface being made byforming a first layer of a metal by electrodepositing the metal using afirst electroplating process resulting in a major surface of the firstlayer having a first average roughness, and forming a second layer ofthe metal on the major surface of the first layer by electrodepositingthe metal on the first layer using a second electroplating processresulting in a major surface of the second layer having a second averageroughness smaller than the first average roughness, the major surface ofthe second layer corresponding to the tool structured surface.

The second structured major surface may be made by microreplication froma second tool structured surface, the second tool structured surfacebeing made by forming a third layer of the metal by electrodepositingthe metal using a third electroplating process resulting in a majorsurface of the third layer having a third average roughness, and forminga fourth layer of the metal on the major surface of the third layer byelectrodepositing the metal on the third layer using a fourthelectroplating process resulting in a major surface of the fourth layerhaving a fourth average roughness smaller than the third averageroughness, the major surface of the fourth layer corresponding to thesecond tool structured surface. The first structured major surface maybe associated with a first haze and the second structured major surfacemay be associated with a second haze, and the first haze may be greaterthan the second haze.

We also disclose display systems that include a light guide, a displaypanel configured to be backlit by light from the light guide, and alight diffusing film disposed in front of the display system such thatthe display panel is between the light guide and the light diffusingfilm. The light diffusing film may have a haze in a range from 10-30%,and the light diffusing film may have a first structured major surfacemade by microreplication from a tool structured surface, the toolstructured surface being made by forming a first layer of a metal byelectrodepositing the metal using a first electroplating processresulting in a major surface of the first layer having a first averageroughness, and forming a second layer of the metal on the major surfaceof the first layer by electrodepositing the metal on the first layerusing a second electroplating process resulting in a major surface ofthe second layer having a second average roughness smaller than thefirst average roughness, the major surface of the second layercorresponding to the tool structured surface.

The first structured major surface of the light diffusing film may havea topography characterizable by a first and second Fourier powerspectrum associated with respective first and second orthogonal in-planedirections, and (a) to the extent the first Fourier power spectrumincludes one or more first frequency peak not corresponding to zerofrequency and being bounded by two adjacent valleys that define a firstbaseline, any such first frequency peak may have a first peak ratio ofless than 0.8, the first peak ratio being equal to an area between thefirst frequency peak and the first baseline divided by an area beneaththe first frequency peak, and (b) to the extent the second Fourier powerspectrum includes one or more second frequency peak not corresponding tozero frequency and being bounded by two adjacent valleys that define asecond baseline, any such second frequency peak may have a second peakratio of less than 0.8, the second peak ratio being equal to an areabetween the second frequency peak and the second baseline divided by anarea beneath the second frequency peak. The first structured majorsurface of the light diffusing film may comprise closely-packedstructures arranged such that ridges are formed between adjacentstructures, the structures being limited in size along two orthogonalin-plane directions, and the first structured major surface may becharacterized by a total ridge length per unit area in plan view of lessthan 200 mm/mm². The first structured major surface may compriseclosely-packed structures, and the structured major surface may providesan optical clarity in a range from 10 to 40%. The first structured majorsurface may face the front of the display system. The first structuredmajor surface may be a front-most surface of the display system.

Related methods, systems, and articles are also discussed. For example,backlights and displays incorporating the disclosed films are alsodisclosed.

These and other aspects of the present application will be apparent fromthe detailed description below. In no event, however, should the abovesummaries be construed as limitations on the claimed subject matter,which subject matter is defined solely by the attached claims, as may beamended during prosecution.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is an SEM image of a portion of the beaded surface of a CCSdiffuser (optical haze=72%, optical clarity=9.9%), and FIG. 1A is an SEMimage of such surface in cross-section;

FIG. 2 is an SEM image of a portion of the beaded surface of a DPBdiffuser (optical haze=97.5%, optical clarity=5%);

FIG. 3 is an SEM image of a portion of the beaded surface of an SDBdiffuser (optical haze=67%, optical clarity=30%);

FIG. 4 is an SEM image of a portion of the structured surface of a TypeI Microreplicated diffusing film (optical haze=91.3%, opticalclarity=1.9%);

FIG. 5 is an SEM image of a portion of the structured surface of a TypeII Microreplicated diffusing film (optical haze=100%, opticalclarity=1.3%);

FIG. 6 is a graph of optical clarity vs. optical haze, depictingapproximate design spaces for Type I and Type II Microreplicateddiffusing films;

FIG. 7 is a schematic side or sectional view of an optical diffusingfilm having a structured surface;

FIG. 8 is a schematic exploded view of a liquid crystal display system,containing various optical films;

FIG. 9 is a schematic flow diagram depicting steps used to makestructured surface articles, including structured surface tools andstructured surface optical films;

FIG. 10 is a schematic perspective view of a structured surface tool inthe form of a cylinder or drum;

FIG. 11A is a schematic side or sectional view of a portion of the toolof FIG. 10;

FIG. 11B is a schematic side or sectional view of the tool portion ofFIG. 11A during a microreplication procedure in which it is used to makethe structured surface of an optical diffusing film;

FIG. 11C is a schematic side or sectional view of a portion of theoptical diffusing film made which results from the microreplicationprocedure depicted in FIG. 11B;

FIG. 12 is a schematic perspective view of an optical diffusing filmthat also includes on an opposed major surface of linear prisms forbrightness enhancement;

FIG. 13 is a graph of optical clarity vs. optical haze, each point onthe graph depicting a different optical diffusing film sample made usinga process in accordance with FIG. 9; FIG. 14 is an SEM image of arepresentative portion of the structured surface of an optical diffusingfilm sample referred to as “502-1”, and FIG. 14A is an SEM image of the502-1 sample in cross-section;

FIG. 15 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “594-1”;

FIG. 16 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “599-1”;

FIG. 17 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “502-2”;

FIG. 18 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “RA22a”;

FIG. 19 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “RA13a”;

FIG. 20 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “N3”;

FIG. 21 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “593-2”;

FIG. 22 is an SEM image of a representative portion of the structuredsurface of an optical diffusing film sample referred to as “597-2”;

FIG. 23 is a graph of power spectral density vs. spatial frequency, thegraph including a hypothetical curve used to demonstrate how the degreeof irregularity or randomness of a structured surface along a givenin-plane direction can be characterized by a Fourier power spectrumassociated with such in-plane direction;

FIG. 24A is a graph of power spectral density vs. spatial frequency in adownweb direction for a sample of the Type I Microreplicated diffusingfilm (optical haze=91.3%, optical clarity=1.9%), and FIG. 24B is asimilar graph for the same sample but in a perpendicular (crossweb)in-plane direction;

FIG. 25A is a graph of power spectral density vs. spatial frequency in adownweb direction for the optical diffusing film sample 502-1, and FIG.25B is a similar graph for the same sample but in the crosswebdirection;

FIG. 26 is a schematic plan view of a portion of a hypotheticalstructured surface with distinguishable structures, demonstrating theconcept of equivalent circular diameter (ECD);

FIG. 27 is a composite image of a picture of the CCS diffuser through aconfocal microscope, on which dark shapes representing the outerboundaries or edges of individual structures of the structured surfaceare superimposed;

FIG. 28 is a composite image of a picture of a Type I Microreplicateddiffusing film sample (optical haze=91.3%, optical clarity=1.9%) througha confocal microscope, on which dark shapes representing the outerboundaries or edges of individual structures of the structured surfaceare superimposed;

FIG. 29 is a composite image similar to FIGS. 27 and 28, but for theoptical diffusing film sample 594-1;

FIG. 30 is a composite image similar to FIGS. 27 through 29, but for theoptical diffusing film sample 502-1;

FIG. 31 is a graph of normalized count versus ECD for a representativesampled area of the optical diffusing film sample 502-1;

FIG. 32 is a schematic side or sectional view of a portion of ahypothetical structured surface with distinguishable structures,demonstrating the concept of maximum height or depth;

FIG. 33 is a schematic plan view of hypothetical individual structureson a structured surface, demonstrating criterion used to determine thepresence of a ridge on the structured surface;

FIG. 34A is a composite image of a picture of the optical diffusing filmsample 594-1 through a confocal microscope, on which dark line segmentsrepresenting ridges that were detected on the structured surface aresuperimposed;

FIG. 34B is an image that shows only the dark line segments of FIG. 34a, i.e., only the detected ridges, in reverse printing (dark/lightreversed); and

FIGS. 35A and 35B are analogous to FIGS. 34A and 34B respectively, butfor the DPB diffuser.

In the figures, like reference numerals designate like elements.

DETAILED DESCRIPTION OF ILLUSTRATIVE EMBODIMENTS

FIG. 7 depicts in schematic side or sectional view a portion of arepresentative diffusing optical film 720 that can be made with thedisclosed processes. The film 720 is shown to have a first major surface720 a and a second major surface 720 b. Incident light 730 is shownimpinging on the film 720 at the second surface 720 b. The light 730passes through the film, and is scattered or diffused as a result ofrefraction (and to some extent diffraction) at the roughened orstructured topography of the major surface 720 a, producing scattered ordiffuse light 732. We may thus refer to the major surface 720 aalternatively as a structured surface 720 a. The orientation of the film720 relative to the incident light 730 may of course be changed suchthat the light 730 impinges initially on the structured surface 720 a,in which case refraction at the structured surface again producesscattered or diffuse light.

The structured surface 720 a extends generally along orthogonal in-planedirections, which can be used to define a local Cartesian x-y-zcoordinate system. The topography of the structured surface 720 a canthen be expressed in terms of deviations along a thickness direction(z-axis), relative to a reference plane (the x-y plane) lying parallelto the structured surface 720 a. In many cases, the topography of thestructured surface 720 a is such that distinct individual structures canbe identified. Such structures may be in the form of protrusions, whichare made from corresponding cavities in the structured surface tool, orcavities, which are made from corresponding protrusions in thestructured surface tool. The structures are typically limited in sizealong two orthogonal in-plane directions, i.e., when the structuredsurface 720 a is seen in plan view, individual structures do nottypically extend indefinitely in a linear fashion along any in-planedirection. Whether protrusions or cavities, the structures may also insome cases be closely packed, i.e., arranged such that at least portionsof boundaries of many or most adjacent structures substantially meet orcoincide. The structures are also typically irregularly or non-uniformlydispersed on the structured surface 720 a. In some cases, some, most, orsubstantially all (e.g., >90%, or >95%, or >99%) of the structures maybe curved or comprise a rounded or otherwise curved base surface. Insome cases, at least some of the structures may be pyramidal in shape orotherwise defined by substantially flat facets. The size of a givenstructure may be expressed in terms of an equivalent circular diameter(ECD) in plan view, and the structures of a structured surface may havean average ECD of less than 15 microns, or less than 10 microns, or in arange from 4 to 10 microns, for example. The structured surface andstructures can also be characterized with other parameters as discussedelsewhere herein, e.g., by an aspect ratio of the depth or height to acharacteristic transverse dimension such as ECD, or the total length ofridges on the surface per unit area in plan view. The optical haze,optical clarity, and other characteristics of the optical diffusingfilms can be provided without the use of any beads at or on thestructured surface, or elsewhere within the optical film.

The film 720 is shown as having a 2-layer construction: a substrate 722that carries a patterned layer 724. The structured surface 720 a ispreferably imparted to the patterned layer 724 by microreplication froma structured surface tool, as explained further below. The substrate 722may for example be a carrier film on which the patterned layer 724 hasbeen cast and cured. Curing of the material used to form the layer 724can be carried out with ultraviolet (UV) radiation, with heat, or in anyother known way. As an alternative to casting-and-curing, the structuredsurface 720 a may be imparted from the tool to the patterned layer 724by embossing a thermoplastic material with sufficient heat and pressure.

The film 720 need not have the 2-layer construction of FIG. 7, but mayinstead include more than 2 layers, or it may be unitary inconstruction, composed of only a single layer. Typically, the layer orlayers that make up the optical diffusing film are highly transmissiveto light, at least to light over a majority of the visible spectrum.Such layer or layers thus typically have a low absorption for suchlight. Exemplary materials for use as a carrier film or substrate 722include light-transmissive polymers such as polyacrylates andpolymethacrylates, polycarbonate, polyethylene terephthalate,polyethylene naphthalate, polystyrene, cyclo olefin polymers, andco-polymers or combinations of these polymer classes. Exemplarymaterials for use as a patterned layer 724 include light transmissivepolymers such as acrylate and epoxy resins. However, other polymermaterials, as well as non-polymer materials, may also be used. The layeror layers may have any suitable index of refraction, for example in arange from 1.4 to 1.8, or from 1.5 to 1.8, or from 1.5 to 1.7, butvalues outside this range can also be used. The index of refraction maybe specified at 550 nm, or at another suitable design wavelength, or itmay be an average over the visible wavelength range. Furthermore, ifdesired, one or more of the layers may include one or more dye(s),pigment(s), and/or other absorbing agents to provide the film with anoverall target transmission, color, or tint. Beads such as glass orceramic microspheres, or other scattering agents, may also be includedif desired, however, the disclosed optical diffusing films may providethe desired amount of haze and clarity without the use of anysignificant number of beads, e.g., without any beads.

As mentioned, the optical diffusing film 720 may have two or morelayers. For example, the substrate 722 may be or comprise a multilayeroptical film in which tens, hundreds, or thousands of individualmicrolayers of different refractive index are arranged in optical repeatunits (e.g., an alternating A B A B pattern) to selectively transmit andreflect light as a function of wavelength, incidence angle, andpolarization. The multilayer optical film may be a reflective polarizer,for example. The substrate 722 may also be laminated to another opticalfilm or substrate with an optically clear adhesive or other suitablebonding material. The substrate 722 may be or comprise a thin flexiblepolymer sheet, e.g. with a minimal thickness as desired in low-profileapplications, or it may be or comprise a relatively thick layer,including in some cases a rigid plate that can provide mechanicalstability or support. The major surface 720 b may be substantially flatand smooth as shown, and exposed to air, or it may be non-flat andnon-smooth. For example, it may have a prismatic pattern, such as thelinear prisms shown in FIG. 12 below.

In other embodiments, the optical diffusing film 720 may be configuredsuch that not only one major surface but both opposed major surfaces arestructured surfaces formed by methods disclosed herein (see FIG. 9below), wherein a given structured major surface of the optical film ismade by microreplication from a tool structured surface, the toolstructured surface being made by forming a first layer of a metal byelectrodepositing the metal using a first electroplating processresulting in a major surface of the first layer having a first averageroughness, and forming a second layer of the metal on the major surfaceof the first layer by electrodepositing the metal on the first layerusing a second electroplating process resulting in a major surface ofthe second layer having a second average roughness smaller than thefirst average roughness, the major surface of the second layercorresponding to the tool structured surface. For example, a secondpatterned layer, the same as or similar to patterned layer 724, may beadded on the other side of the optical diffusing film 720 at the surface720 b. The structured surface tools used to make the opposed majorsurfaces of such an optical diffusing film may be the same or similar,such that the haze provided by each major surface in isolation is aboutthe same. Alternatively, the structured surface tools used to make theopposed major surfaces of the film may be substantially different, suchthat the haze provided by one major surface (in isolation) issubstantially greater than that provided by the other major surface (inisolation). In any case, the overall haze and clarity of the opticalfilm as a whole is a combination of the individual hazes and clarities(respectively) associated with the opposed major surfaces.

The structured surface 720 a of the optical diffusing film is typicallyexposed to air such that light is refracted in different directions atits surface, but in other embodiments coatings or other layers can beapplied to the structured surface 720 a. One such coating is aquarter-wave anti-reflective (AR) coating, which may have a refractiveindex between that of the patterned layer 724 and air. Such an ARcoating may be thin enough to substantially maintain the topography ofthe structured surface, whereby light diffusing characteristics (hazeand clarity) for transmitted light are substantially unchanged. Thickercoatings and layers can also be applied such that the structured surface720 a is embedded between the patterned layer 724 and a planarizationlayer; however, the planarization layer preferably has a substantiallydifferent refractive index than that of the patterned layer so thatadequate refraction occurs at the surface 720 a to provide the desiredamount of haze and clarity. Refraction and haze can be maximized orincreased by increasing the refractive index difference between thepatterned layer 724 and the planarization layer. This may beaccomplished by making the planarization layer out of an ultra-low index(ULI) material, which may have a nanovoided morphology to achieve theultra-low refractive index. Such nanovoided ULI materials may have arefractive index of less than 1.4, or less than 1.3, or less than 1.2,or in a range from 1.15 to 1.35. Many such ULI materials may bedescribed as porous materials or layers. When used in combination withmore common optical polymer materials that are not nanovoided, and thathave substantially higher refractive indices such as greater than 1.5 orgreater than 1.6, a relatively large refractive index difference Δn canbe provided across the embedded structured surface. Suitable ULImaterials are described e.g. in WO 2010/120864 (Hao et al.) and WO2011/088161 (Wolk et al.), which are incorporated herein by reference.

Among the various parameters that can be used to characterize theoptical behavior of a given optical diffusing film, two key parametersare optical haze and optical clarity. Light diffusion or scattering canbe expressed in terms of “optical haze”, or simply “haze”. For a film,surface, or other object that is illuminated by a normally incidentlight beam, the optical haze of the object refers essentially to theratio of transmitted light that deviates from the normal direction bymore than 4 degrees to the total transmitted light as measured, forexample, using a Haze-Gard Plus haze meter (available from BYK-Gardner,Columbia, Md.) according to the procedure described in ASTM D1003, orwith a substantially similar instrument and procedure. Related tooptical haze is optical clarity, which is also measured by the Haze-GardPlus haze meter from BYK-Gardner, but where the instrument is fittedwith a dual sensor having a circular middle sensor centered within anannular ring sensor, the optical clarity referring to the ratio(T₁−T₂)/(T₁+T₂), where T₁ is the transmitted light sensed by the middlesensor and T₂ is the transmitted light sensed by the ring sensor, themiddle sensor subtending angles from zero to 0.7 degrees relative to anaxis normal to the sample and centered on the tested portion of thesample, and the ring sensor subtending angles from 1.6 to 2 degreesrelative to such axis, and where the incident light beam, with no samplepresent, overfills the middle sensor but does not illuminate the ringsensor (underfills the ring sensor by a half angle of 0.2 degrees).

The optical diffusing films that can be made with the disclosedprocesses can be used in a wide variety of possible end-useapplications. One application of particular interest is electronicdisplay systems. One such display system, a liquid crystal display 802,is shown schematically in FIG. 8. The display 802 is instructive becauseit shows a number of different components that can incorporate thedisclosed optical diffusing films and structured surfaces. The display802 includes a light guide, a bottom diffuser, prismatic brightnessenhancement films (BEF films), a liquid crystal display (LCD) panel, anda front film, arranged as shown in the figure. The display alsotypically includes one or more visible light sources (e.g. white LED(s),or red/green/blue LED(s), or a white CCFL (cold cathode fluorescent)source) (not shown) disposed proximate the light guide to inject lightinto the light guide. A user 801 is disposed in front of the display 802to view the images it generates. The display 802 need not include everycomponent shown in FIG. 8, and it may include additional components. Forexample, in alternative embodiments, the display 802 may omit the bottomdiffuser, or one or both of the BEF films, or the front film.Alternative embodiments may also incorporate additional components, suchas multiple different types of front films, or a reflective polarizingfilm, or a high reflectivity mirror film (for placement behind the lightguide), for example.

One or more optical diffusing film as disclosed herein can be includedin the display 802 as a stand-alone component, e.g. as a film like thatshown in FIG. 7, with one flat major surface and an opposed structuredmajor surface that diffuses light, or with both opposed major surfacesbeing structured surfaces that diffuse light. Alternatively or inaddition, one or more optical diffusing film as disclosed herein can beincluded in the display 802 as part of another component or film, e.g.when combined with a prismatic BEF film as shown and described inconnection with FIG. 12 below.

One use of optical diffusing films disclosed herein is as the bottomdiffuser in the display 802. Due to the proximity of the bottom diffuserto the light guide, and because light guides can be highly spatiallynon-uniform in brightness over their output surface, e.g. as a result ofdiscrete extractor dots provided on the output surface of the lightguide, it is often desirable for the bottom diffuser to have a highhaze, e.g., greater than 80% or greater than 90% haze. However, thebottom diffuser may alternatively have a haze outside these ranges.

In some cases, e.g. in order to provide high overall haze for a bottomdiffuser, it may be desirable to design the optical diffusing film suchthat both opposed major surfaces of the film are structured surfacesformed by the methods disclosed herein. Both major surfaces may thus bestructured as described herein to provide (in isolation) desired amountsof light diffusion, and the overall light diffusion provided by the film(e.g. in terms of haze and clarity) is then a combination of the lightdiffusion provided by these surfaces. The major surfaces may bestructured in similar ways, e.g., they may have similar averageroughnesses, and may be individually associated with similar amounts ofhaze. Alternatively, the major surfaces may be structured insubstantially different ways, e.g., they may have substantiallydifferent average roughnesses, and may be individually associated withsubstantially different amounts of haze. In such alternativeembodiments, the optical diffusing film, when used as a bottom diffuserbetween a light guide and a display panel, may be oriented such that afirst structured major surface of the diffusing film faces the displaypanel and the second structured major surface of the diffusing filmfaces the light guide, and such that the first structured major surfaceis associated with a first haze and the second structured major surfaceis associated with a second haze, the first haze being greater than thesecond haze. That is, the structured major surface facing the displaypanel may have a greater average roughness than the structured majorsurface facing the light guide. The roughness provided by the structuredsurface facing the light guide may help to avoid wet-out artifacts whenthe optical diffusing film is placed in contact with the light guide.The opposite orientation, in which the structured major surface facingthe light guide has a greater average roughness than the structuredmajor surface facing the display panel, is also contemplated.

Another use of an optical diffusing film as disclosed herein is incombination with one or more of the BEF films in the display 802. Theoptical diffusing film may be used as a backside coating on only one, oron both, of the BEF films. In an exemplary construction, the opticaldiffusing film may be used as a backside coating on only the BEF filmthat is nearest the front of the display 802. Use of the opticaldiffusing film as a backside coating on a BEF film is described inconnection with FIG. 12 below. When used in combination with a BEF film,it is often desirable for the diffusing film to have a low haze, e.g., ahaze of 10% or less. However, the diffusing film may alternatively havea haze outside this range.

Still another use of an optical diffusing film as disclosed herein is incombination with one or more front film in the display 802. Althoughonly one front film is shown in FIG. 8, multiple front films may beused. Front film(s) are disposed between the LCD panel and the user 801.One useful front film is a privacy film, which restricts the cone ofviewing angles over which the image formed by the LCD panel can beperceived. Another useful front film is an anti-reflective (AR) film.Anti-reflective films may incorporate a quarter-wave low index coating,or more complex multi-layered interference coatings, to reduce surfacereflections by the mechanism of optical interference. Still anotheruseful front film is an anti-glare film. Anti-glare films reduce glarethrough the mechanism of optical scattering or diffusion. Yet anotheruseful film is a protection film. Protection films may providescratch-resistance or abrasion-resistance by incorporating a hard coaton the film. Front film functionalities can be combined, e.g. a singlefront film may provide both anti-glare and privacy functionality. Thestructured major surface of the disclosed optical diffusing films can beused in any one or more of the front films that may be included indisplay 802. When used in or as a front film, it is often desirable forthe diffusing film to have a medium low haze, e.g. a haze in a rangefrom 10-30%. Haze values outside of this range may however also be used.The disclosed structured major surfaces that provide optical diffusionmay be used as the front-most major surface of the front-most frontfilm. That is, the major surface of the display that is immediatelyaccessible to the user 801, which the user 801 may readily touch with afinger or stylus, for example, may incorporate the light-diffusingstructured surfaces disclosed herein.

When an optical diffusing film is used in combination with other filmsand components, e.g. as in the display 802, undesirable opticalartifacts may arise. Stated differently, if two different opticaldiffusing films of different design are both tailored to have the sameoptical haze and clarity values, those films may nevertheless providevery different visual results when placed in an optical display or othersystem. The visual results may differ with respect to optical artifactsincluding those known as “sparkle” and moire. “Sparkle” may arise whenan optical film is laid atop or against a second film, layer, or objectwhose major surface is patterned in some fashion. “Sparkle” refers to anoptical artifact that appears as a grainy texture (texture mura) thatconsists of small regions of bright and dark luminance in what appearsto be a random pattern. The position of the bright and dark regions canvary as the viewing angle changes, making the texture especially evidentand objectionable to a viewer. Sparkle can appear as a result of anoptical interaction between some types of non-smooth surfaces andanother structure in proximity to it. To avoid the sparkle artifact, itis desirable to utilize structures on the surface that are <100 microns,or which have very little periodicity, or which do not form micro-imagesof the proximate structure, or any combination of these attributes.

A moire pattern is a known optical artifact commonly associatedoverlapping window screens or the like, but moire patterns can alsoarise when combining an optical film with a second film, layer, orobject that is patterned in some fashion. In modern displays, the liquidcrystal display panel itself is pixelated, and possesses one periodicpattern. BEF films are also often included in displays, and these alsopossess periodicity associated with the pitch or spacing of the linearprisms. If an optical film such as an optical diffusing film is insertedinto the display, any spatial periodicity possessed by the optical filmcan interact with the periodicity of the display panel, the periodicityof the BEF films, or the periodicity of any other component in thesystem to produce moire pattern(s). Such patterns are highly undesirablein display applications. Therefore, in an optical diffusing film madefrom a structured surface, it is desirable for the structured surface tohave little or no spatial periodicity.

We have developed a process that can be used to form structured surfacesthat are well suited for making high performance optical diffusingfilms. The process can produce a structured surface in amicroreplication tool of considerable surface area, e.g., a surface areaat least as large as that of a typical desktop computer display screen,in a period of time that is short compared to the time it would take toproduce a structured surface of equal area and comparable feature sizeby cutting features in a substrate with a cutting tool. This is becausethe process can employ electroplating techniques rather than cuttingtechniques to produce the structured surface. (However, in some casesdescribed further below, electroplating can be used in addition tocutting.) The process can be tailored to produce a wide variety ofstructured surfaces, including structured surfaces that provide veryhigh haze (and low clarity), structured surfaces that provide very lowhaze (and high clarity), and structured surfaces in between theseextremes. The process can utilize a first electroplating procedure inwhich a preliminary structured surface is produced, the preliminarystructured surface corresponding substantially to that of a Type IIMicroreplicated diffusing film discussed above. Recall in connectionwith FIG. 6 that Type II Microreplicated diffusing films cover a generaldesign space that has relatively high optical clarity. We have foundthat by covering the preliminary structured surface with a secondelectrodeposited layer using a second electroplating procedure, a secondstructured surface is obtained, and the second structured surface canproduce diffusing films of high, low, or intermediate haze, depending onprocess conditions; however, diffusing films made from the secondstructured surface are different from those made from the preliminarystructured surface. In particular, interestingly, diffusing films madefrom the second structured surface fall within a general design spacehaving a substantially lower clarity (for intermediate values of haze)than the design space for Type II Microreplicated diffusing films. Thiswill be shown in connection with optical diffusing films made inaccordance with the developed process. At least some of the opticaldiffusing films are also shown to possess other desirablecharacteristics, including a topography characterized by little or nospatial periodicity, and average feature sizes less than 15 microns, orless than 10 microns.

FIG. 9 shows an exemplary version 901 of the process. In a step 902 ofthe process, a base or substrate is provided that can serve as afoundation upon which metal layers can be electroplated. The substratecan take one of numerous forms, e.g. a sheet, plate, or cylinder.Circular cylinders are advantageous in that they can be used to producecontinuous roll goods. The substrate is typically made of a metal, andexemplary metals include nickel, copper, and brass. Other metals mayhowever also be used. The substrate has an exposed surface (“basesurface”) on which electrodeposited layers will be formed in subsequentsteps. The base surface may be smooth and flat, or substantially flat.The curved outer surface of a smooth polished cylinder may be consideredto be substantially flat, particularly when considering a small localregion in the vicinity of any given point on the surface of thecylinder. The base surface may be characterized by a base averageroughness. In this regard, the surface “roughness” of the base surface,or the “roughness” of other surfaces mentioned herein, may be quantifiedusing any generally accepted roughness measure, such as averageroughness R_(a) or root mean squared roughness R_(rms), and theroughness is assumed to be measured over an area large enough to befairly representative of the entire relevant area of the surface atissue.

In a step 903 of the process 901, a first layer of a metal is formed onthe base surface of the substrate using a first electroplating process.Before this step is initiated, the base surface of the substrate may beprimed or otherwise treated to promote adhesion. The metal may besubstantially the same as the metal of which the base surface iscomposed. For example, if the base surface comprises copper, the firstelectroplated layer formed in step 903 may also be made of copper. Toform the first layer of the metal, the first electroplating process usesa first electroplating solution. The composition of the firstelectroplating solution, e.g., the type of metal salt used in thesolution, as well as other process parameters such as current density,plating time, and substrate speed, are selected so that the firstelectroplated layer is not formed smooth and flat, but instead has afirst major surface that is structured, and characterized by irregularflat-faceted features. The size and density of the irregular featuresare determined by the current density, plating time, and substratespeed, while the type of metal salt used in the first electroplatingsolution determines the geometry of the features. Further teaching inthis regard can be found in patent application publication US2010/0302479 (Aronson et al.). The first plating process is carried outsuch that the first major surface of the first electroplated layer has afirst average roughness that is greater than the base average roughnessof the substrate. The structured character and roughness of arepresentative first major surface can be seen in the SEM image of FIG.5, which shows the structured surface of a Type II Microreplicateddiffusing film, the film being microreplicated from the first majorsurface of a first electroplated layer made in accordance with step 903.

After the first electroplated layer of the metal is made in step 903,with its structured major surface of first average roughness, a secondelectroplated layer of the metal is formed in step 904 using a secondelectroplating process. The second layer of the metal covers the firstelectroplated layer, and, since their compositions may be substantiallythe same, the two electroplated layers may no longer be distinguishable,and the first major surface of the first layer may become substantiallyobliterated and no longer detectable. Nevertheless, the secondelectroplating process differs from the first electroplating process insuch a way that the exposed second major surface of the secondelectroplated layer, although structured and non-flat, has a secondaverage roughness that is less than the first average roughness of thefirst major surface. The second electroplating process may differ fromthe first electroplating process in a number of respects in order toprovide the second major surface with a reduced roughness relative tothe first major surface.

In some cases, the second electroplating process of step 904 may use asecond electroplating solution that differs from the firstelectroplating solution in step 903 at least by the addition of anorganic leveler, as shown in box 904 a. An organic leveler is a materialthat introduces into a plating bath an ability to produce depositsrelatively thicker in small recesses and relatively thinner on smallprotrusions with an ultimate decrease in the depth or height of thesmall surface irregularities. With a leveler, a plated part will havegreater surface smoothness than the basis metal. Exemplary organiclevelers may include, but are not limited to, sulfonated, sulfurizedhydrocarbyl compounds; allyl sulfonic acid; polyethylene glycols ofvarious kinds; and thiocarbamates, including bithiocarbamates orthiourea and their derivatives. The first electroplating solution maycontain, at most, trace amounts of an organic leveler. The firstelectroplating solution may have a total concentration of organic carbonless than 100, or 75, or 50 ppm. A ratio of a concentration of anorganic leveler in the second electroplating solution to a concentrationof any organic leveler in the first electroplating solution may be atleast 50, or 100, or 200, or 500, for example. The average roughness ofthe second major surface can be tailored by adjusting the amount oforganic leveler in the second electroplating solution.

The second electroplating process of step 904 may also or alternativelydiffer from the first electroplating process of step 903 by including inthe second step 904 at least one electroplating technique or featurewhose effect is to reduce the roughness of the second major surfacerelative to the first major surface. Thieving (box 904 b) and shielding(box 904 c) are examples of such electroplating techniques or features.Furthermore, in addition to or instead of an organic leveler, one ormore organic grain refiners (box 904 d) may be added to the secondelectroplating solution to reduce the average roughness of the secondmajor surface.

After step 904 is completed, the substrate with the first and secondelectroplated layers may be used as an original tool with which to formoptical diffusing films. In some cases the structured surface of thetool, i.e., the structured second major surface of the secondelectroplated layer produced in step 904, may be passivated or otherwiseprotected with a second metal or other suitable material. For example,if the first and second electroplated layers are composed of copper, thestructured second major surface can be electroplated with a thin coatingof chromium. The thin coating of chromium or other suitable material ispreferably thin enough to substantially preserve the topography and theaverage roughness of the structured second major surface.

Rather than using the original tool itself in the fabrication of opticaldiffusing films, one or more replica tools may be made bymicroreplicating the structured second major surface of the originaltool, and the replica tool(s) may then be used to fabricate the opticalfilms. A first replica made from the original tool will have a firstreplica structured surface which corresponds to, but is an inverted formof, the structured second major surface. For example, protrusions in thestructured second major surface correspond to cavities in the firstreplica structured surface. A second replica may be made from the firstreplica. The second replica will have a second replica structuredsurface which corresponds to, and is a non-inverted form of, thestructured second major surface of the original too.

After step 904, after the structured surface tool is made, opticaldiffusing films having the same structured surface (whether inverted ornon-inverted relative to the original tool) can be made in step 906 bymicroreplication from the original or replica tool. The opticaldiffusing film may be formed from the tool using any suitable process,including e.g. embossing a pre-formed film, or cast-and-curing a curablelayer on a carrier film.

Turning now to FIG. 10, pictured there is a schematic view of astructured surface tool 1010 in the form of a cylinder or drum. The tool1010 has a continuous major surface 1010 a that we assume has beenprocessed in accordance with the method of FIG. 9 so that it has anappropriately structured surface. The tool has a width w and a radius R.The tool can be used in a continuous film manufacturing line to makeoptical diffusing film by microreplication. A small portion P of thetool 1010, or of an identical tool, is shown schematically in FIG. 11A.

In FIG. 11A, a structured surface tool 1110, assumed to be identical totool 1010, is shown in schematic cross-section. Having been made by theprocess of FIG. 9, the tool 1110 is shown in the figure as including asubstrate 1112, a first electroplated layer 1114 of a metal having astructured first major surface 1114 a, and a second electroplated layer1116 of the metal, the second layer 1116 having a structured secondmajor surface 1116 a which coincides with the structured major surface1110 a of the tool 1110. In accordance with the teachings of FIG. 9, thesecond major surface 1116 a is structured or non-smooth, and it has anaverage roughness less than that of the first major surface 1114 a. Thefirst major surface 1114 a, and the distinct layers 1114, 1116, areshown for reference purposes in FIG. 11a , however, as noted above, theformation of the second electroplated layer 1116 atop the firstelectroplated layer 1114 may render the first major surface 1114 a, andthe distinction between layers 1114 and 1116, undetectable.

In FIG. 11B, we show a schematic view of the tool 1110 of FIG. 11Aduring a microreplication procedure in which it is used to make thestructured surface of an optical diffusing film 1120. Like referencenumerals from FIG. 11A designate like elements, and need not bediscussed further. During microreplication, the film 1120 is pressedagainst the tool 1110 so that the structured surface of the tool istransferred (in inverted form) with high fidelity to the film. In thiscase, the film is shown to have a base film or carrier film 1122 and apatterned layer 1124, but other film constructions can also be used. Thepatterned layer may be for example a curable material, or athermoplastic material suitable for embossing. The microreplicationprocess causes the major surface 1120 a of the optical film 1120, whichcoincides with the major surface 1124 a of the patterned layer 1124, tobe structured or roughened in corresponding fashion to the structuredmajor surface 1110 a of the tool.

In FIG. 11C, the optical film 1120 made in the microreplicationprocedure of FIG. 11B is shown separated from the tool 1110. The film1120, which may be the same as or similar to optical diffusing film 720of FIG. 7, may now be used as an optical diffusing film.

The disclosed optical diffusing films may be stand-along diffusingfilms, as suggested by the views of FIGS. 7 and 11C, or they may becombined with other optical films or components to provide additionalfunctionality. In FIG. 12, an optical diffusing film, in the form of abackside coating having a structured surface as disclosed herein, iscombined with a linear prismatic BEF film, to provide a dual functionlight redirecting optical film 1200. The optical diffusing film orbackside coating in such an embodiment typically provides a relativelylow amount of haze, e.g., a haze of 10% or less.

The optical film 1200 includes a first major surface 1210 that includesa plurality of prisms or other microstructures 1250 that extend alongthe y-direction. The optical film 1200 also includes a second majorsurface 1220 that is opposite the first major surface 1210, and that isstructured in accordance with the method of FIG. 9. The second majorsurface 1220 may include individual microstructures 1260.

The optical film 1200 also includes a substrate layer 1270 that isdisposed between the major surfaces 1210, 1220, and that includes afirst major surface 1272 and an opposing second major surface 1274. Theoptical film 1200 also includes a prism layer 1230 disposed on the firstmajor surface 1272 of the substrate layer and includes the first majorsurface 1210 of the optical film, and a patterned layer 1240 disposed onthe second major surface 1274 of the substrate layer and includes thesecond major surface 1220 of the optical film. The patterned layer 1240has a major surface 1242 opposite the major surface 1220.

The optical film 1200 includes three layers 1230, 1270, and 1240. Ingeneral, however, the optical film 1200 can have one or more layers. Forexample, in some cases, the optical film can have a single layer thatincludes respective first and second major surfaces 1210 and 1220. Asanother example, in some cases, the optical film 1200 can have manylayers. For example, in such cases, the substrate 1270 can have multiplelayers.

Microstructures 1250 are primarily designed to redirect light that isincident on major surface 1220 of the optical film, along a desireddirection, such as along the positive z-direction. In the exemplaryoptical film 1200, microstructures 1250 are prismatic linear structures.In general, microstructures 1250 can be any type of microstructures thatare capable of redirecting light by, for example, refracting a portionof an incident light and recycling a different portion of the incidentlight. For example, the cross-sectional profiles of microstructures 1250can be or include curved and/or piece-wise linear portions. For example,in some cases, microstructures 1250 can be linear cylindrical lensesextending along the y-direction.

Each linear prismatic microstructure 1250 includes an apex angle 1252and a height 1254 measured from a common reference plane such as, forexample, major plane surface 1272. In some cases, such as when it isdesirable to reduce optical coupling or wet-out and/or improvedurability of the optical film, the height of a prismatic microstructure1250 can change along the y-direction. For example, the prism height ofprismatic linear microstructure 1251 varies along the y-direction. Insuch cases, prismatic microstructure 1251 has a local height that variesalong the y-direction, a maximum height 1255, and an average height. Insome cases, a prismatic linear microstructure, such as linearmicrostructure 1253, has a constant height along the y-direction. Insuch cases, the microstructure has a constant local height that is equalto the maximum height and the average height.

In some cases, such as when it is desirable to reduce optical couplingor wet-out, some of the linear microstructures are shorter and some ofthe linear microstructures are taller. For example, height 1256 oflinear microstructure 1253 is smaller than height 1258 of linearmicrostructure 1257.

Apex or dihedral angle 1252 can have any value that may be desirable inan application. For example, in some cases, apex angle 1252 can be in arange from about 70 degrees to about 110 degrees, or from about 80degrees to about 100 degrees, or from about 85 degrees to about 95degrees. In some cases, microstructures 150 have equal apex angles whichcan, for example, be in a range from about 88 or 89 degree to about 92or 91 degrees, such as 90 degrees.

Prism layer 1230 can have any index of refraction that may be desirablein an application. For example, in some cases, the index of refractionof the prism layer is in a range from about 1.4 to about 1.8, or fromabout 1.5 to about 1.8, or from about 1.5 to about 1.7. In some cases,the index of refraction of the prism layer is not less than about 1.5,or not less than about 1.55, or not less than about 1.6, or not lessthan about 1.65, or not less than about 1.7.

In some cases, such as when the optical film 1200 is used in a liquidcrystal display system, the optical film 1200 can increase or improvethe brightness of the display. In such cases, the optical film has aneffective transmission or relative gain that is greater than 1.Effective transmission, in this regard, refers to the ratio of theluminance of the display system with the film in place in the displaysystem to the luminance of the display without the film in place.

In an alternative embodiment to that of FIG. 12, the prism layer 1230can be replaced with a second patterned layer which may be the same asor similar to patterned layer 1240. Then, both the patterned layer 1240and the second patterned layer may have structured surfaces that arefabricated according to the method of FIG. 9. The structured surfacesmay be configured to provide (in isolation) respective haze values thatare the same or substantially the same, or that are substantiallydifferent.

EXAMPLES

A number of optical diffusing film samples were made according tomethods as shown in FIG. 9. Thus, in each case, a structured surfacetool was made under a set of process conditions, and then the structuredsurface of the tool was microreplicated to form a correspondingstructured surface (in inverted form) as a major surface of the opticalfilm. (The opposed major surface of each optical film was flat andsmooth.) The structured surface provided each optical film with a givenamount of optical haze and optical clarity. The haze and clarity of eachoptical diffusing film sample was measured with the Haze-Gard Plus hazemeter from BYK-Gardiner. The following table sets forth some of thechemical solutions that were used during the fabrication of varioussamples, as explained further below:

TABLE 1 Some Solutions Used Element Component Supplier Quantity Alkalinecleaner 25% Sodium hydroxide Hawkins Chemical 30% v/v (NaOH)(Minneapolis, MN) 16% Sodium carbonate Hawkins Chemical 3.5% v/v TritonX-114 Dow Chemical 0.9% v/v Company (Midland, MI) Mayoquest L-50 VulcanPerformance 0.9% v/v Chemicals (Birmingham, AL) Dowfax C6L Dow Chemical1.4% v/v Company Deionized (DI) water Balance (15-18 megaohm) Citricacid solution Citric acid 15% Hawkins Chemical 33% v/v solution DI waterBalance Sulfuric acid solution Sulfuric acid 96% Mallinckrodt Baker 1%v/v reagent grade (Phillipsburg, NJ) DI water Balance First copper bathLiquid copper sulfate Univertical (Angola, 53.5 g/L as copper (68.7 g/Lcopper) IN) Sulfuric acid 96% Mallinckrodt Baker 60 g/L as H₂SO₄ reagentgrade Hydrochloric acid 37% Mallinckrodt Baker 60 mg/L as Cl⁻ reagent DIwater Balance Second copper bath Liquid copper sulfate Univertical 53.5g/L as copper (68.7 g/L copper) Sulfuric acid 96% Mallinckrodt Baker 60g/L as H₂SO₄ reagent grade Hydrochloric acid 37% Mallinckrodt Baker 60mg/L as Cl⁻ reagent Grain refiner Cuflex Atotech USA (Rock 1.4% v/v 321Hill, SC) DI water Balance Chrome bath Liquid chromic acid Atotech USA250 g/L as CrO₃ (440 g/L CrO₃) Sulfuric acid 96% Mallinckrodt Baker 2.5g/L reagent grade Trivalent chromium 0-20 g/L byproduct DI water Balance

Preliminary Tool

A copper-coated cylinder, having a diameter of 16 inches and a length of40 inches, was used as a base for the construction of a tool. The tool,which is referred to here as a preliminary tool because it was madeusing only one of the electroplating steps shown in FIG. 9, was firstdegreased with a mild alkaline cleaning solution, deoxidized with asulfuric acid solution, and then rinsed with deionized water. Thecomposition of the alkaline cleaner, as well as the compositions ofother relevant solutions, are shown in Table 1. The preliminary tool wasthen transferred while wet to a copper plating tank (Daetwyler Cu MasterJunior 18). It was rinsed with approximately 1 liter of the sulfuricacid solution at the start of the plating cycle to remove surface oxide.The preliminary tool was then immersed at a 50% level in the firstcopper bath. The bath temperature was 25° C. The copper bath was treatedwith carbon-filled canisters to remove organic contamination.Effectiveness of the treatment was verified both by using a 1000 mLbrass Hull Cell panel that is plated at 5 amps for 5 minutes andevaluated for lack of brightness, and by TOC (total organic carbon)analysis using a persulfate TOC analyzer. TOC levels were determined tobe below 45 parts per million (ppm). The preliminary tool was DC-platedat a current density of 60 amps per square foot (with a ramp up time atthe start of 5 seconds) for 45 minutes while being rotated at 20 rpm.The distance from the anode to the nearest point on the tool duringplating was approximately 45 mm. When plating was completed, thethickness of the plated copper, which we refer to as a first copperlayer, was approximately 30 microns. The first copper layer had anexposed structured surface that was roughened with a multitude of flatfacets.

Rather than covering the first copper layer with an electroplated secondcopper layer of lesser average roughness (in accordance with FIG. 9),for reference purposes, this preliminary tool, and in particular thestructured surface of the first copper layer, was used to make a Type IIMicroreplicated diffusing film. This involved cleaning the preliminarytool and electroplating a chromium coating on the structured surface ofthe first copper layer. The chromium coating was thin enough tosubstantially preserve the topography of the first copper layerstructured surface.

Accordingly, the preliminary tool, with the structured surface of thefirst copper layer still exposed, was washed with deionized water and aweak acid solution to prevent oxidation of the copper surface. Next, thepreliminary tool was moved to a Class 100 clean room, placed in acleaning tank, and rotated at 20 rpm. The preliminary tool wasdeoxidized using a citric acid solution, and then washed with analkaline cleaner. After that it was rinsed with deionized water,deoxidized again with the citric acid solution, and rinsed withdeionized water.

The preliminary tool was transferred to a chrome plating tank while wetand 50% immersed in the tank. The bath temperature was 124° F. The toolwas DC-plated with chromium using a current density of 25 amps persquare decimeter while the preliminary tool moved at a surface speed of90 meters/minute. The plating continued for 400 seconds. Upon completionof plating, the preliminary tool was rinsed with deionized water toremove any remaining chrome bath solution. The chromium coating servesto protect the copper to prevent oxidation, and, as mentioned, it wasthin enough to substantially preserve the topography of the first copperlayer structured surface.

The preliminary tool was transferred to a cleaning tank where it wasrotated at 10 rpm, washed with 1 liter of deionized water at ambienttemperature, then washed with 1.5 liters of denatured alcohol (SDA-3A,reagent grade at ambient temperature) applied slowly to cover the entiretool surface. The tool rotation speed was then increased to 20 rpm. Itwas then air dried.

Type II Microreplicated Optical Diffusing Film

Once the preliminary tool was dried, a hand-spread film was made fromthe tool using a UV-curable acrylate resin coated on a primed PET film.This procedure microreplicated the structured surface of the firstcopper layer to produce a corresponding structured surface (but invertedrelative to that of the preliminary tool) on the cured resin layer ofthe film. Due to its method of construction, the film was a Type IIMicroreplicated optical diffusing film. A scanning electron microscope(SEM) image of the film's structured surface is shown in FIG. 5. Theoptical haze and clarity of the film were measured with a Haze-Gard Plussystem from BYK Gardner (Columbia MD), and found to be 100%, and 1.3%,respectively.

First Tool

Another structured surface tool, referred to here as the first tool, wasthen made. Unlike the preliminary tool, the first tool was made usingboth electroplating steps shown in FIG. 9, so that the first copperlayer was covered with an electroplated second copper layer of lesseraverage roughness.

The first tool was prepared in the same way as the preliminary tool, upto the chromium plating step. Then this first tool, with its firstcopper layer whose structured surface was of relatively high averageroughness (substantially an inverted version of FIG. 5), was transferredbefore drying to a copper plating tank set up for additional plating.The first tool was rinsed with approximately one liter of the sulfuricacid solution, before the start of a second plating cycle, to removesurface oxide generated during the loading of the tool into the tank.The first tool was then 50% immersed in the second copper bath in aDaetwyler Cu Master Junior 18 tank. The bath temperature was 25° C. Thesecond copper bath was carbon treated to remove organic contamination,as described above for the preliminary tool. After the carbon treatment,the second copper bath was recharged with an organic grain refiner(Cutflex 321 at a concentration of 14 milliliters/liter), such that thesecond copper bath had the composition shown above in Table 1. Thecomposition of the second copper bath differed from that of the firstcopper bath by the addition of the organic grain refiner. The anode waspositioned at a distance of approximately 45 mm from the first tool. Thefirst tool was then DC plated for 12 minutes in the second copper bathusing a current density of 60 amps per square foot while being rotatedat 20 rpm. The current ramp time was about 5 seconds. This produced asecond electroplated copper layer which covered the first copper layer,the second copper layer having a structured surface of lesser averageroughness than that of the first copper layer. The thickness of thesecond copper layer was 8 microns.

The first tool was then transferred to a cleaning tank. It was rotatedat 10-12 revolutions per minute while being washed with approximately 1liter of deionized water at ambient temperature using a hose with aspray nozzle. A second wash was done using 1 to 2 liters of the citricacid solution at ambient temperature. Then the first tool was washedwith approximately 3 liters of deionized water to remove excess citricacid using a hose with a spray nozzle. Next the first tool was rinsedwith approximately 2 liters of denatured ethanol (SDA 3A of reagentgrade) applied slowly at ambient temperature to cover the entire toolsurface in order to aid in drying. The first tool was then air dried.Next, the first tool was moved to a Class 100 clean room, cleaned, andchrome plated, in the same way as was done with the preliminary tool.The chromium plating substantially retained the topography of thestructured surface of the second copper layer.

Sample 502-1

After air drying, the first tool was used to make a film via a handspread. This too was done in the same way as was done with thepreliminary tool, and it produced an optical diffusing film (referred toherein with the sample designation number 502-1) having amicroreplicated structured surface on the cured resin layer of the filmcorresponding to (but inverted relative to) the structured surface ofthe second copper layer. An SEM image of the film's structured surfaceis shown in FIG. 14. Although the surface is structured, one can seethat the average roughness of the surface is less than that of thestructured surface of FIG. 5. An SEM image of a cross-section of the502-1 sample is shown in FIG. 14a . The optical haze and clarity of thisoptical diffusing film sample 502-1 were measured with the Haze-GardPlus system from BYK Gardner (Columbia MD), and found to be 92.8%, and6.9%, respectively. These values are listed in Table 2 below.

Second Tool

Another structured surface tool, referred to here as the second tool,was made. The second tool was made in substantially the same way as thefirst tool, except that the composition of the second copper bath wasdifferent: two organic grain refiners were used (Cutflex 321 at aconcentration of 14 milliliters/liter, and Cutflex 320H at aconcentration of 70 milliliters/liter), rather than just one. The secondcopper plating step was, however, again completed in 12 minutes, whichproduced a second electroplated copper layer whose thickness was 8microns. After chrome plating the structured surface of the secondcopper layer, the second tool was ready to be used for microreplicationto an optical film.

Sample 594-1

The second tool was then used to make a film via a hand spread. This wasdone in the same way as was done with the first tool, and it produced anoptical diffusing film (referred to herein with the sample designationnumber 594-1) having a microreplicated structured surface on the curedresin layer of the film corresponding to (but inverted relative to) thestructured surface of the second copper layer. An SEM image of thefilm's structured surface is shown in FIG. 15. Although the surface isstructured, one can see that the average roughness of the surface isless than that of the structured surface of FIG. 5. The optical haze andclarity of this optical diffusing film sample 594-1 were measured withthe Haze-Gard Plus system from BYK Gardner (Columbia Md.), and found tobe 87.9%, and 6.9%, respectively. These values are listed in Table 2below.

Third Tool

Another structured surface tool, referred to here as the third tool, wasmade. The third tool was made in substantially the same way as thesecond tool, except that the second copper plating was completed in 18minutes rather than 12 minutes, which produced a second electroplatedcopper layer whose thickness was about 12 microns. After chrome platingthe structured surface of the second copper layer, the third tool wasready to be used for microreplication to an optical film.

Sample 593-2

The third tool was then used to make a film via a hand spread. This wasdone in the same way as was done with the first and second tools, and itproduced an optical diffusing film (referred to herein with the sampledesignation number 593-2) having a microreplicated structured surface onthe cured resin layer of the film corresponding to (but invertedrelative to) the structured surface of the second copper layer. An SEMimage of the film's structured surface is shown in FIG. 21. Although thesurface is structured, one can see that the average roughness of thesurface is less than that of the structured surface of FIG. 5. Theoptical haze and clarity of this optical diffusing film sample 593-2were measured with the Haze-Gard Plus system from BYK Gardner (ColumbiaMd.), and found to be 17.1%, and 54.4%, respectively. These values arelisted in Table 2 below.

Fourth Tool

Another structured surface tool, referred to here as the fourth tool,was made. In order to make this fourth tool, two plating solutions wereprepared. A first plating solution consisted of 60 g/L of sulfuric acid(J.T. Baker Chemical Company, Philipsburg, N.J.) and 217.5 g/L of coppersulfate (Univertical Chemical Company, Angola, Ind.). A second platingsolution consisted of the contents of the first plating solution plusadditives CUPRACID HT leveler (0.05% by volume), CUPRACID HT finegrainer (0.1% by volume), and CUPRACID HT wetting agent (0.3% byvolume), all available from Atotech USA. Both solutions were made withdeionized water. An 8 inch by 8 inch copper sheet was placed in a tankholding the first plating solution. The tank size was 36 inches(length)×24 inches (width)×36 inches (depth). The sheet was plated at21° C. for 24 hours using a current density of 10 amps per square footwith a flow rate of 8 gallons per minute created using a circulationpump. This first plating step produced a first electrodeposited copperlayer having a relatively rough structured surface, the thickness of theelectrodeposited layer being about 330 microns. The plate was removedfrom the first plating solution, rinsed, and dried. The copper sheetwith the first electroplated layer was then cut into a 1.5 inch×8 inchsection. The backside of the section was shielded with adhesive tape andplaced in a four-liter beaker containing the second plating solution,and plated at 25° C. for 35 minutes at a current density of 35 amps persquare foot. This second plating step produced a second electrodepositedcopper layer which covered the first copper layer, and the second copperlayer had a structured surface whose average roughness was less thanthat of the first copper layer. The thickness of the second copper layerwas about 28 microns. After the second plating step, the section, whichis referred to as the fourth tool, was rinsed and dried. Unlike thefirst, second, and third tools, the second copper layer of the fourthtool was not plated with chromium. Instead, the exposed structuredsurface of the second copper layer was used directly formicroreplication of an optical film.

It was discovered that, in contrast to the tools used to make the otheroptical diffusing film samples disclosed herein, the copper sheet usedas a starting material to make the fourth tool deviated significantlyfrom flatness, in particular, it contained substantially linear periodicundulations. These undulations were carried over into the structuredsurfaces of the first and second copper layers, such that the structuredsurface of the second copper layer contained not only roughnessattributable to the electroplating steps, but also an undulationoriginating from the base copper sheet upon which the electrodepositedcopper layers were formed.

Sample RA13a

The fourth tool was then used to make a film via a hand spread. This wasdone by applying a polyester film substrate with a uv-curable acrylateresin to the fourth tool. The resin was cured using a uv-processor fromRPC Industries (Plainfield, Ill.) with a line speed of 50 feet perminute. The film was then removed from the structured surface of thefourth tool. The film was an optical diffusing film (referred to hereinwith the sample designation number RA13a) having a microreplicatedstructured surface on the cured resin layer of the film corresponding to(but inverted relative to) the structured surface of the second copperlayer. An SEM image of the film's structured surface is shown in FIG.19. The faint periodic vertical lines seen in the figure are a result ofthe periodic undulations in the copper sheet starting material, and werenot introduced by the two copper electroplating steps. The optical hazeand clarity of this optical diffusing film sample RA13a were measured aswith the other samples, and found to be 25.9%, and 19.4%, respectively.These values are listed in Table 2 below.

Samples 507-1, 600-1, 554-1, 597-1, 551-1, and 599-1

The tools used to make these optical diffusing film samples were made inthe same manner as the tools for samples 502-1 and 594-1 above, exceptthat one or more of the following were varied for the secondelectroplating step: the amount of organic leveler used, the currentdensity, and the plating time. The samples themselves were then madefrom their respective tools via a hand spread in the same manner assamples 502-1 and 594-1, and the haze and clarity were measured as withthe other samples. The measured values are listed in Table 2 below. AnSEM image of the structured surface of film sample 599-1 is shown inFIG. 16.

Samples 502-2, 554-2, 551-2, 597-2, and 600-2

The tools used to make these optical diffusing film samples were made inthe same manner as the tool for sample 593-2 above, except that one ormore of the following were varied for the second electroplating step:the amount of organic leveler used, the current density, and the platingtime. The samples themselves were then made from their respective toolsvia a hand spread in the same manner as sample 593-2, and the haze andclarity were measured as with the other samples. The measured values arelisted in Table 2 below. An SEM image of the structured surface of filmsample 502-2 is shown in FIG. 17. An SEM image of the structured surfaceof film sample 597-2 is shown in FIG. 22.

Samples RA13c, RA13b, RA22a, L27B, RA14b, RA24a, RA24b, N3, and N2

The tools used to make these optical diffusing film samples were made inthe same manner as the tool for sample RA13a above (i.e., the fourthtool), except that (i) the copper sheet used as a starting material wasflat and smooth and did not contain the periodic undulations, and (ii)one or more of the following were varied for the first or secondelectroplating step: the current density, and the plating time. Thesamples themselves were then made from their respective tools via a handspread in the same manner as sample RA13a, and the haze and clarity weremeasured as with the other samples. The measured values are listed inTable 2 below. An SEM image of the structured surface of film sampleRA22a is shown in FIG. 18. An SEM image of the structured surface offilm sample N3 is shown in FIG. 20.

TABLE 2 Measured Optical Haze and Clarity Sample Haze (%) Clarity (%)600-2 1.57 88.3 597-2 2.5 83.1 551-2 5.3 72.5 RA24b 7.41 56.8 N2 8.276.6 554-2 11.7 41.1 RA24a 12.1 40.4 RA14b 13.9 57.8 L27B 14 51.1 593-217.1 54.4 N3 24.9 32.1 RA13a 25.9 19.4 RA22a 54.6 15.5 502-2 67.3 9599-1 72.4 8.4 RA13b 72.5 9.1 551-1 79.4 10 RA13c 80 9.5 597-1 85.6 8.6554-1 87.4 7.3 594-1 87.9 6.9 502-1 92.8 6.9 600-1 95 6.8 507-1 96.4 6.1

Each optical diffusing film sample listed in Table 2 was made using aprocess in accordance with FIG. 9. The measured haze and measuredclarity values in this table are plotted in the optical clarity vs.optical haze graph of FIG. 13. The points on the graph are labeledaccording to the sample designation numbers in Table 2. Of the sampleslisted in Table 2, SEM images of the structured surfaces are providedfor: sample 502-1 (FIGS. 14, 14A); sample 594-1 (FIG. 15); sample 599-1(FIG. 16); sample 502-2 (FIG. 17); sample RA22a (FIG. 18); sample RA13a(FIG. 19); sample N3 (FIG. 20); sample 593-2 (FIG. 21); and sample 597-2(FIG. 22). Inspection of these images reveals one or more of:

-   -   discernible individual structures (e.g. in the form of distinct        cavities and/or protrusions) that can be seen in the structured        surface;    -   individual structures that are limited in size along two        orthogonal in-plane directions;    -   individual structures that are closely packed;    -   individual structures that are rounded or curved (crater-like or        dome-like, with curved base surfaces);    -   individual structures that are pyramidal or flat-faceted; and    -   combinations of non-uniformly arranged larger structures, and        closely packed smaller structures non-uniformly dispersed        between the larger structures.

Some of these samples were evaluated in a display. For example, thesamples 551-2 and 593-2 were used as backside diffusers (see e.g. FIGS.8 and 12) in the display, and the samples 599-1, 551-1, 597-1, 554-1,594-1, 502-1, 600-1, and 507-1 were used as bottom diffusers (see e.g.FIGS. 8 and 7) in the display. Moire artifacts were not observed, andsparkle and graininess were very weak. (Graininess and sparkle, asdiscussed above, can cause unwanted spatial variation in illumination ofa liquid crystal panel. Graininess can produce undesired noise on animage, while sparkle has the additional artifact of such noise varyingwith viewing angle.)

Further Discussion—Structured Surface Characterization

Further analysis work was performed to identify characteristics ofstructured surfaces which, whether alone or in combination with othercharacteristics, may be used to characterize at least some of thestructured surfaces made by the method of FIG. 9, and/or to distinguishat least some such structured surfaces from those of other opticaldiffusing films, such as SDB diffusers, DPB diffusers, CCS diffusers,Type I Microreplicated diffusing films, and Type II Microreplicateddiffusing films. Several characterization parameters were studied inthis regard, including:

-   -   power spectral density (PSD) of the topography along orthogonal        in-plane directions, as a measure of spatial irregularity or        randomness;    -   identification of individual structures (in plan view) that make        up the structured surface, and measurement of the in-plane size        or transverse dimension (such as ECD) of such structures;    -   ratio of depth or height to in-plane size of the structures; and    -   identification of ridges on the structured surface, and        measurement of ridge length (in plan view) per unit area.        This further analysis work will now be discussed.

Power Spectral Density (PSD) Analysis

Part of the analysis work focused on the topography of the structuredsurface, and sought to determine the degree of spatial irregularity orrandomness of the surface. The topography can be defined relative to areference plane along which the structured surface extends. For example,the structured surface 720 a of film 720 (see FIG. 7) lies generally in,or extends generally along, an x-y plane. Using the x-y plane as areference plane, the topography of the structured surface 720 a can thenbe described as the height of the surface 720 a relative to thereference plane as a function of position in the reference plane, i.e.,the z-coordinate of the surface as a function of (x,y) position. If wemeasure the topography of a structured surface in this manner, we canthen analyze the spatial frequency content of the topographical functionto determine the degree of spatial irregularity or randomness of thesurface (or to identify spatial periodicities present in the structuredsurface).

Our general approach was to analyze the spatial frequency content usingFast Fourier Transform (FFT) functions. Because the topography providesheight information along two orthogonal in-plane directions (x and y),the spatial frequency content of the surface is fully characterized byanalyzing the spatial frequency content along each of the in-planedirections. We determined the spatial frequency content by measuring thetopography over a sufficiently large, and representative, portion of thestructured surface, and calculating a Fourier power spectrum for eachin-plane direction. The two resulting power spectra could then beplotted on graphs of power spectral density (PSD) versus spatialfrequency. To the extent the resulting curves contain any localfrequency peaks (not corresponding to zero frequency), the magnitude ofsuch a peak can be expressed in terms of a “peak ratio” describedfurther below in connection with FIG. 23.

Having described our general approach, we now describe our approach tothe PSD analysis in more detail. For a given optical diffusing filmsample, a ˜1×1 cm piece of the sample was cut from the central portionof the sample. The sample piece was mounted on a microscope slide, andits structured surface was Au—Pd sputter-coated. Two height profiles ofthe structured surface were obtained using confocal scanning lasermicroscopy (CSLM). Whenever possible, fields of view were chosen to givea good sampling of the topography and any periodicity that was present.The 2-dimensional (2D) power spectral density (PSD) was calculated foreach 2D height profile. The 2D PSD is the square of the magnitude of the2D spatial Fourier transform of the 2D height profile. MATLAB was usedto calculate the PSD using MATALB's Fast Fourier Transform (FFT)function. Before using the FFT, a 2D Hamming window was applied to the2D height profile to help reduce ringing in the FFT caused by the finitespatial dimensions of the 2D height profile. The 2D PSD was summed inthe x-direction to give the 1-dimensional (1D) PSD in the y-direction(downweb direction). Likewise, the 2D PSD was summed in the y-directionto give the 1D PSD in the x-direction (crossweb direction).

Analysis of the 1D PSDs with regard to spatial frequency peaks will nowbe described in connection with FIG. 23. In that figure, a hypotheticalFourier power spectrum curve is shown for illustrative purposes. Thecurve, which may represent either of the 1D PSD functions (x or y)discussed above, appears on a graph of power spectral density (PSD)versus spatial frequency. The vertical axis (PSD) is assumed to beplotted on a linear scale starting at zero. The curve is shown as havinga frequency peak which (a) does not correspond to zero frequency, and(b) is bounded by two adjacent valleys that define a baseline. The twoadjacent valleys are identified by points p1, at spatial frequency f1,and p2, at spatial frequency f2. The frequency f1 may be considered thefrequency at which the peak starts, and f2 may be considered thefrequency at which the peak ends. The baseline is the straight linesegment (dashed line) that connects p1 and p2. Keeping in mind that thevertical axis (PSD) is on a linear scale starting at zero, the magnitudeof the peak can be expressed in terms of the areas A and B on the graph.The area A is the area between the frequency peak and the baseline. Thearea B is the area under or beneath the baseline. That is,B=(PSD(f1)+PSD(f2))*(f2−f1)/2. The sum A+B is the area under or beneaththe frequency peak. Given these definitions, the magnitude of the peakcan now be defined in terms of a relative peak amplitude or “peak ratio”as follows:

peak ratio=A/(A+B).

In practice, we evaluated two 1D PSDs (two Fourier power spectra—one forthe x-direction, one for the y-direction) for each sample that wasevaluated, and we identified, to the extent the Fourier power spectrumincluded any frequency peaks, the most prominent peak for each curve.The above-described peak ratio was then calculated for the mostprominent peak for each curve. Since the most prominent peak wasmeasured, the calculated peak ratio is an upper limit for all peaks thatmay be present in the given Fourier power spectrum.

These PSD measurements were performed not only on optical diffusingfilms made according to the method of FIG. 9, but also on two Type IMicroreplicated diffusing film samples. The two Type I Microreplicateddiffusing film samples were made in general accordance with theteachings of the '622 Aronson et al., '593 Yapel et al., '475 Barbie,and '261 Aronson et al. references cited above, these two samplesreferred to herein as “Type I Micro—1” and “Type I Micro—4”. Thesesamples were made under differing conditions, and had different hazevalues. In particular, the Type I Micro—1 sample had a haze of 91.3% andclarity of 1.9%, and the Type I Micro—4 sample had a haze of 79.1% and aclarity of 4.5%. The SEM image in FIG. 4 is a picture of the Type IMicro—1 sample.

FIGS. 24A and 24B are graphs, for the downweb and crossweb in-planedirections respectively, of power spectral density vs. spatial frequencyfor the Type I Micro—1 sample. In each graph, “f1” and “f2” are thefrequencies at which the most prominent peak was determined to start andend, respectively. Although these graphs use a logarithmic scale for thepower spectral density (PSD), the A and B values used for thecalculation of peak ratio were calculated based on a linear PSD scale,consistent with the description above.

FIGS. 25A and 25B are graphs for the downweb and crossweb directionsrespectively of power spectral density vs. spatial frequency for theoptical diffusing film sample 502-1. The labels “f1” and “f2” have thesame meanings in these figures as in FIGS. 23, 24A, and 24B. The A and Bvalues used to calculate peak ratio were based on a linear PSD scale,even though a log scale is used in FIGS. 25A, 25B.

The calculated PSD peak ratios for seven of the optical diffusing filmsmade in accordance with the method of FIG. 9, and for the two Type IMicroreplicated diffusing film samples, are listed in Table 3.

TABLE 3 Measured PSD Peak Ratios Measured peak Measured peak Sampleratio (downweb) ratio (crossweb) 502-1 0.24 0.15 594-1 0.12 0.23 502-20.10 0.17 593-2 0.19 0.12 RA22a 0.21 0.11 RA13a 0.14 0.76 N3 0.08 0.21Type I Micro - 1 0.94 0.19 Type I Micro - 4 0.99 0.84

In reviewing the results of Table 3, we see that for each of the opticaldiffusing films made in accordance with FIG. 9, the peak ratio for bothin-plane directions (downweb and crossweb) is less than 0.8, and, inmost cases, much less than 0.8. In comparison, although the Type IMicro—1 sample had a peak ratio of 0.19 in the crossweb direction, inall other cases the tested Type I Microreplicated diffusing films hadpeak ratios greater than 0.8. Thus, neither of the tested Type IMicroreplicated diffusing films satisfies the condition that the peakratio for both in-plane directions is less than 0.8.

In reviewing the results of Table 3, we also see that all except one ofthe tested film samples made in accordance with FIG. 9 also satisfy amore stringent condition that the peak ratio for both in-planedirections is less than 0.5, or 0.4, or 0.3. The relatively small valuesfor peak ratio in both in-plane directions are suggestive of ultra-lowspatial periodicity in the structured surfaces. The sample RA13a,however, does not meet the more stringent conditions. Out of all thetested film samples made in accordance with FIG. 9, the RA13a sample hasby far the highest measured peak ratio, a ratio of 0.76 in the crosswebdirection. In the orthogonal in-plane direction, the RA13a sample has amuch smaller 0.14 peak ratio. Recall from the description above that theRA13a sample was made with a copper sheet starting material thatcontained periodic undulations, and these periodic undulations weretransferred to the structured major surface of the RA13a sample duringmicroreplication. In view of this, it is reasonable to conclude that ifthe substrate for RA13a had been substantially flat with no undulations,the peak ratio in the crossweb direction would be much closer to thedownweb peak ratio of 0.14. Stated differently, to the extent a toolmade in accordance with FIG. 9 is made using a flat substrate that hasno underlying structure, such a tool (and any optical film made from thetool) is likely to have PSD peak ratios in both in-plane directions ofless than 0.8, or 0.5, or 0.4, or 0.3.

Similarly, to the extent a tool made in accordance with FIG. 9 is madeusing a substrate that has significant underlying structure (whetherperiodic undulations, or more defined structure such as a prismatic BEFstructured surface), such a tool (and any optical film made from thetool) is likely to exhibit a significant or large peak in the powerspectral density curve for at least one in-plane direction, and islikely to have a significant or large PSD peak ratio in such in-planedirection. In such cases, by engaging in a more in-depth analysis of thePSD measurements, particularly if information is available about theunderlying structure in the original substrate, one may distinguishbetween peaks in the power spectral density curve that are due to theunderlying structure of the substrate used to form the tool, and peaksthat are due to the structures that were formed as a result of theelectroplating steps (see steps 903 and 904 in FIG. 9). Making such adistinction may be complex, because the spatial periodicit(ies) of theunderlying structure need not be significantly different than anyspatial periodicit(ies) of the electroplated structure, in fact, thespatial periodicities of these different structures types may in atleast some cases substantially overlap. Nevertheless, if one succeeds inmaking such a distinction, then the condition for a structured surfacethat the PSD peak ratios in both in-plane directions be less than 0.8(or 0.5, or 0.4, or 0.3) may still be satisfied by a structured surfacethat was made in accordance with FIG. 9 using a substrate withsignificant underlying structure, provided that any peaks in the powerspectral density curves that are due to the underlying structure aredisregarded.

The results given in Table 3 were obtained by identifying a mostprominent peak, if present, in the power spectral density curve. Anddata for the power spectral density curves, as can be seen in FIGS. 24Athrough 25B, extended over a spatial frequency range from roughly 1 mm⁻¹to almost 2000 mm⁻¹, hence, any peaks that may be present throughoutthat range are candidates in the determination of which peak is the mostprominent, and they are also candidates with respect to the criterionthat the PSD peak ratios in both in-plane directions are less than 0.8(or 0.5, or 0.4, or 0.3). In practice, it may be advantageous to limitthe spatial frequency range over which peaks in the power spectraldensity curves are considered for these analyses. For example, it may beadvantageous to limit the spatial frequency range over which the PSDpeak ratios in both in-plane directions are specified to be less than0.8 (or 0.5, or 0.4, or 0.3), to a frequency range whose upper limit is1000, or 500, or 100 mm⁻¹, and whose lower limit is 1, or 2, or 5 mm⁻¹.

Transverse Dimension or Size (ECD) Analysis

For a structured surface in which distinct individual structures can beidentified, the structured surface can be described in terms of acharacteristic size, such as a transverse or in-plane dimension, of thestructures. Each structure may for example be characterized as having alargest transverse dimension, a smallest transverse dimension, and anaverage transverse dimension. If the individual structures are limitedin size along two orthogonal in-plane directions, e.g., not extendingindefinitely in a linear fashion along any in-plane direction, eachstructure may be characterized as having an equivalent circular diameter“ECD”. The ECD of a given structure may be defined as the diameter of acircle whose area in plan view is the same as the area in plan view ofthe structure. For example, with reference to FIG. 26, a plan view of ahypothetical structured surface 2620 a is shown. The structured surfacecomprises distinguishable structures 2621 a, 2621 b, 2621 c, 2621 d,which may be protrusions or cavities. A circle 2623 a is superimposed onthe structure 2621 a, the circle allegedly having in this plan view anarea equal to that of the structure 2621 a. The diameter (ECD) of thecircle 2623 a is the equivalent circular diameter (ECD) of the structure2621 a. By averaging the ECD values for all of the structures in arepresentative portion of the structured surface, the structured surfaceor structures thereof may then be said to have an average equivalentcircular diameter ECD_(avg).

We undertook a systematic analysis of structure size for a number ofoptical diffusing films. For a given optical diffusing film sample, a˜1×1 cm piece of the sample was cut from the central portion of thesample. The sample piece was mounted on a microscope slide, and itsstructured surface was Au—Pd sputter-coated. Two height profiles of thestructured surface were obtained using confocal scanning lasermicroscopy (CSLM). Whenever possible, fields of view were chosen to givea good sampling of the topography. Depending on what type of structurewas predominant in the sample, either peaks or valleys were sized. Aconsistent and repeatable methodology was established for sizing theindividual structures that were identified on the structured surface.The composite images of FIGS. 27-30 provide an indication of how thiswas done. In these composite images, dark outline shapes aresuperimposed on a picture of the structured surface through a confocalmicroscope. The dark outline shapes are the computed outer boundaries oredges of individual structures of the structured surface. FIG. 27 issuch a composite image for the CCS diffuser. FIG. 28 is for the Type IMicro—1 sample discussed above. FIG. 29 is for the optical diffusingfilm sample 594-1. FIG. 30 is for the optical diffusing film sample502-1. Using such images and techniques, the ECD of typically hundredsand in some cases thousands of structures was calculated for a givenstructured surface. The ECD measurements and measurement statistics aresummarized as follows:

TABLE 4 Measured ECD Statistics ECD mean ECD median ECD sigma Sample(um) (um) (um) 502-1 10.3 9.7 3.6 594-1 6.1 6.1 2.6 593-2 5.8 5.5 2.5RA13a 58.3 58.5 17.5 N3 6.3 6.0 3.3 Type I Micro - 1 15.0 15.8 4.7 TypeI Micro - 2 15.3 17.3 5.6 Type I Micro - 3 16.5 17.8 4.6 Type I Micro -4 16.8 17.5 3.5 Type I Micro - 5 17.6 18.1 3.5 Type I Micro - 6 17.518.3 4.2 Type II Micro 9.2 8.8 2.8 CCS Diffuser 3.6 3.0 2.0

The samples Type I Micro—2, Type I Micro—3, Type I Micro—5, and Type IMicro—6 are additional Type I Microreplicated diffusing film samplesthat were made in general accordance with the teachings of the '622Aronson et al., '593 Yapel et al., '475 Barbie, and '261 Aronson et al.references cited above. The Type I Micro—2 sample had a haze of 90.7%and clarity of 2.9%, the Type I Micro—3 sample had a haze of 84.8% and aclarity of 4.7%, the Type I Micro—5 sample had a haze of 73.9% and aclarity of 5.5%, and the Type I Micro—6 sample had a haze of 68.2% and aclarity of 4.9%. The Type II Micro sample in Table 4 was an opticaldiffusing film similar to the Type II Microreplicated diffusing filmshown in FIG. 5, but the Type II Micro sample of Table 4 had a haze of91.1% and a clarity of 9.8%.

In reviewing the results of Table 4, we see that, except for the RA13asample, each of the optical diffusing films made in accordance with FIG.9 had an average (mean) ECD of less than 15 microns, and most had anaverage ECD of less than 10 microns, or in a range from 4 to 10 microns.This was in contrast to the average ECD of the Type II Microreplicateddiffusing film samples, which was generally at least 15 microns or more.The RA13a sample had a substantially higher average ECD than any of theother films made in accordance with FIG. 9. The periodic undulations ofthe RA13a sample discussed above are believed to be the reason for thislarge difference. That is, it is reasonable to conclude that if thesubstrate for RA13a had been substantially flat with no undulations, theaverage ECD would have been much closer to that of the other similarlyfabricated films, e.g., less than 15 and less than 10 microns.

The structured surfaces of some of the samples made by the method ofFIG. 9 were observed to contain a combination of irregularly arrangedlarger pyramidal structures, between which closely-packed smallerstructures were irregularly dispersed. One such sample was 502-1. Ananalysis of the structured surface was done, and the results, shown ascurve 3110 in the graph of FIG. 31, demonstrate that the surface has abimodal distribution of structure sizes. The graph of FIG. 31 plots thenormalized count (in percent per bin) as a function of ECD in microns.Curve 3110 is seen to have a larger peak 3110 a and a smaller peak 3110b. The larger peak 3110 a is located at about ECD=8 microns, andcorresponds to the smaller structures on the structured surface. Thesmaller peak 3110 b is located at about ECD=24 microns, and correspondsto the larger pyramidal structures. Thus, the average size of thesmaller structures is less than 15 microns, and less than 10 microns,and the average size of the larger structures is greater than 15microns, and greater than 20 microns. Due to the smaller population ofthe larger structures, the average ECD for all structures (large andsmall) on the structured surface is 10.3 microns, as reported in Table4.

Aspect Ratio of Height to Transverse Dimension (ECD) Analysis

Some of the films made by the method of FIG. 9 had structured surfacesin which individual structures were closely packed and, in some cases,the structures were also curved or had curved base surfaces. We decidedto investigate the relationship between the in-plane or transversedimension (e.g. ECD) of the structures and the mean height of thestructures. In general, the term “height” is broad enough to refer tothe height of a protrusion as well as to the depth of a cavity. Forcomparison purposes we included in our investigation the DPB diffuser,which has a densely-packed beaded surface.

The height of an exemplary structure is illustrated in the drawing of ahypothetical structured surface in FIG. 32. In the figure, an opticaldiffusing film 3220 includes a patterned layer 3222 with a structuredmajor surface 3220 a. The structured surface 3220 a includes discernibleindividual structures 3221 a, 3221 b. The structured surface extendsalong or defines an x-y plane. Three reference planes parallel to thex-y plane are shown: RP1, RP2, and RP3. The reference planes RP1, RP3may be defined in terms of the highest and lowest portions(respectively) of the structure 3221 a. The reference plane RP2 may belocated at a position corresponding to zero or near-zero curvature,i.e., the surface at that position is neither curved inwardly, as at thetop of a peak, nor curved outwardly, as at the bottom of a cavity. Giventhese reference planes, one can define a height h1 between RP1 and RP2,and a height h2 between RP2 and RP3.

We undertook a systematic analysis of determining an aspect ratio ofstructures on a given structured surface, the aspect ratio being theheight divided by the ECD of the structure. For the height of thestructure, we elected to use a value corresponding substantially to h1shown in FIG. 32. For a given optical diffusing film sample, a ˜1×1 cmpiece of the sample was cut from the central portion of the sample. Thesample piece was mounted on a microscope slide, and its structuredsurface was Au—Pd sputter-coated. Two height profiles of the structuredsurface were obtained using confocal scanning laser microscopy (CSLM).Whenever possible, fields of view were chosen to give a good sampling ofthe topography. Valleys (cavities) in the structured surfaces weresized; however, when evaluating the structured surface of the DPBdiffuser, the height profile of the structured surface was invertedbefore sizing to convert peaks to valleys, for ease of calculation. Aswas done with the ECD measurements described above, a consistent andrepeatable methodology was established for sizing the individualstructures that were identified on the structured surface. Themethodology was then modified to add the measurement of the height todiameter aspect ratio (Hmean/ECD). The ratio was calculated for eachstructure (valley region). The height Hmean was the mean height on theperimeter of the structure (valley region) minus the minimum height inthe structure (valley region). The height map in the valley region wastilt corrected using the data points on the perimeter before the heightwas measured. The mean aspect ratios for the tested samples werecalculated, and are shown in Table 5.

TABLE 5 Aspect Ratio Sample mean aspect ratio 502-1 0.078 594-1 0.069597-2 0.006 DPB diffuser 0.210

In reviewing the results of Table 5, we see that the samples made by themethod of FIG. 9 can be readily distinguished from the DPB diffuser onthe basis of aspect ratio. For example, the average aspect ratio of theformer samples is less than 0.15, or less than 0.1.

Ridge Analysis

As mentioned above, some of the films made by the method of FIG. 9 hadstructured surfaces in which individual structures were closely packed.The closely packed structures tend to produce ridge-like features,although ridge-like features may also occur in the absence of closelypacked structures. We decided to investigate aspects of ridges onstructured surfaces. In particular, we investigated the extent to whichridges were present on the structured surface. We quantified this bycalculating the total ridge length per unit area of structured surfacein plan view. This was done for many of the samples made according tothe method of FIG. 9, and, for comparison purposes, we also includedseveral beaded diffusers: the SDB diffuser, the CCS diffuser, and theDPB diffuser.

A ridge is illustrated in the drawing of a hypothetical structuredsurface in FIG. 33. In the figure, an optical diffusing film includes astructured major surface 3320 a. The structured surface 3320 a includesdiscernible individual structures 3321 a, 3321 b, 3321 c. The structuredsurface extends along or defines an x-y plane. A ridge, which may bedescribed as a long, sharp, peaked region, is formed along at least ashort segment at which the boundaries of the structures 3321 a, 3321 bcome together. The ridge or segment includes points p1, p2, p3. Thelocal slope and curvature at each of these points, based on the knowntopography, can be calculated along directions (see axes a1, a2, a3)that are parallel to a gradient and perpendicular to the ridge, as wellas along directions (see axes b1, b2, b3) that are perpendicular to thegradient and parallel to the ridge. Such curvatures and slopes can beused to confirm that the points lie on a long, sharp peaked region. Forexample, points on the ridge may be identified by: a sufficientlydifferent curvature along the two perpendicular directions (e.g. a1,b1); a sharp curvature perpendicular to the ridge (e.g. a1); a slope inthe gradient direction (e.g. along the ridge, see b1) that is less thanthe average slope; and a segment length that is sufficiently long.

We undertook a systematic analysis of determining the ridge length perunit area on a given structured surface using the foregoing principles.For a given optical diffusing film sample, a ˜1×1 cm piece of the samplewas cut from the central portion of the sample. The sample piece wasmounted on a microscope slide, and its structured surface was Au—Pdsputter-coated. Two height profiles of the structured surface wereobtained using confocal scanning laser microscopy (CSLM). Wheneverpossible, fields of view were chosen to give a good sampling of thetopography. Ridge analysis was used to analyze the height profiles inaccordance with the above principles.

The ridge analysis identified the peaks of ridges on a 2D height map andcalculated the total length of ridges per unit sample area. Curvaturealong the gradient direction and transverse to the gradient directionwas calculated about each pixel. Thresholding on the curvature and slopewere carried out to identify ridges.

The following is the definition of a ridge that was used in the ridgeanalysis.

-   -   1. Curvature definitions: (a) gcurvature is the curvature along        the gradient direction; (b) tcurvature is the curvature along        the direction transverse (perpendicular) to the gradient        direction; (c) gcurvature is calculated by using three points        along the gradient and calculating the circle that circumscribes        the three points; the gcurvature=1/R, where R is the radius of        this circle; (d) tcurvature is calculated by using three points        along the direction transverse to the gradient and calculating        the circle that circumscribes the three points; the        gcurvature=1/R, where R is the radius of this circle; (e) the        curvature is assigned to the center point of these three        points; (f) the spacing of the three points is chosen to be        large enough to reduce the contribution by fine features that        are not of interest but small enough so that the contribution by        features of interest is preserved.    -   2. The curvature of a point on the ridge is sufficiently        different between two perpendicular directions. (a) The        gcurvature and tcurvature differ by at least a factor of 2        (either can be larger).    -   3. The ridge is sharper than most of the valleys. (a) Curvature        is greater than the absolute value of the 1 percentile point of        the gcurvature distribution (1% of the gcurvature is lower than        the 1 percentile point).    -   4. The slope is lower than the mean slope. (a) gslope (slope        along the gradient) on ridge is less than the mean gslope of the        surface. (b) The slope on the top of a ridge is typically near        zero unless it is on a highly sloped surface.    -   5. The ridge is sufficiently long. (a) A potential ridge is not        considered a ridge if its total length (including branches) is        shorter than the mean radius of curvature along the potential        ridge top; (b) A potential ridge is not considered a ridge if        its total length is shorter than 3 times the mean width of the        potential ridge; (c) Note that these dimensions are measured        approximately.    -   6. Branches are sufficiently long. (a) A branch from the        midsection of a ridge is considered a continuation of the ridge        if it is longer than 1.5 times the mean width of the ridge.        Otherwise, it is removed; (b) Note that these dimensions are        measured approximately.

The composite images of FIGS. 34A and 35A provide an indication of howthe systematic ridge identification was done. In these composite images,dark line segments are superimposed on a picture of the structuredsurface through a confocal microscope. The dark line segments are areasof the structured surface identified as ridges. FIG. 34A is such acomposite image for the 594-1sample. FIG. 35A is for the DPB diffuser.FIG. 34B corresponds to FIG. 34A, but shows only the dark line segments(i.e. the detected ridges) but in reverse printing so the ridges can bemore easily seen. FIG. 35B likewise corresponds to FIG. 35A, but showsonly the dark line segments and in reverse printing.

After identifying the ridges, the total length of all the ridges in theheight map was calculated and divided by the area of the height map.This analysis was also repeated for identifying valley ridges byinverting the height maps before running the analysis. Note that the DPBsample was inverted to begin with. Using such images and techniques, theridge length per area was calculated for the tested structured surfaces.The results of these measurements are summarized as follows:

TABLE 6 Measured Ridge Length per Area Ridge Length per Area Sample(mm/mm²) 502-1 47.3 507-1 48.3 551-1 29.7 554-1 111.8 594-1 109.5 597-144.2 599-1 89.3 600-1 116.8 502-2 32.3 551-2 18.8 554-2 35.2 593-2 36.4597-2 1.1 600-2 0.1 N3 50.5 L27B 0.3 RA24a 0.2 RA13a 0.0 SDB diffuser2.2 CCS diffuser 4.4 DPB diffuser 244.8

In reviewing the results of Table 6, we see that all or most of thenon-beaded samples made by the method of FIG. 9 have structured surfacescharacterized by a total ridge length per unit area in plan view of lessthan 200 mm/mm², and less than 150 mm/mm², and in a range from 10 to 150mm/mm².

Unless otherwise indicated, all numbers expressing quantities,measurement of properties, and so forth used in the specification andclaims are to be understood as being modified by the term “about”.Accordingly, unless indicated to the contrary, the numerical parametersset forth in the specification and claims are approximations that canvary depending on the desired properties sought to be obtained by thoseskilled in the art utilizing the teachings of the present application.Not as an attempt to limit the application of the doctrine ofequivalents to the scope of the claims, each numerical parameter shouldat least be construed in light of the number of reported significantdigits and by applying ordinary rounding techniques. Notwithstandingthat the numerical ranges and parameters setting forth the broad scopeof the invention are approximations, to the extent any numerical valuesare set forth in specific examples described herein, they are reportedas precisely as reasonably possible. Any numerical value, however, maywell contain errors associated with testing or measurement limitations.

The following are exemplary embodiments according to the presentdisclosure:

-   Item 1. A method of making a structured surface, comprising:    -   forming a first layer of a metal by electrodepositing the metal        using a first electroplating process resulting in a first major        surface of the first layer having a first average roughness; and    -   forming a second layer of the metal on the first major surface        of the first layer by electrodepositing the metal on the first        major surface using a second electroplating process resulting in        a second major surface of the second layer having a second        average roughness smaller than the first average roughness.-   Item 2. The method of item 1, wherein the first electroplating    process uses a first electroplating solution and the second    electroplating process uses a second electroplating solution, the    second electroplating solution differing from the first    electroplating solution at least by the addition of an organic    leveler.-   Item 3. The method of item 1, wherein the second electroplating    process comprises thieving.-   Item 4. The method of item 1, wherein the second electroplating    process comprises shielding.-   Item 5. The method of item 1, wherein the first electroplating    process uses a first electroplating solution and the second    electroplating process uses a second electroplating solution, the    second electroplating solution differing from the first    electroplating solution at least by the addition of an organic grain    refiner.-   Item 6. The method of item 1, further comprising:    -   providing a base surface having a base average roughness;    -   wherein the first layer is formed on the base surface, and        wherein the first average roughness is greater than the base        average roughness.-   Item 7. The method of Item 1, wherein the metal is copper.-   Item 8. The method of item 1, wherein the first electroplating    process uses a first electroplating solution that contains at most    trace amounts of an organic leveler.-   Item 9. The method of item 8, wherein the first electroplating    solution has a total concentration of organic carbon less than 100,    or 75, or 50 ppm.-   Item 10. The method of item 1, wherein the first electroplating    process uses a first electroplating solution and the second    electroplating process uses a second electroplating solution, and    wherein a ratio of a concentration of an organic leveler in the    second electroplating solution to a concentration of any organic    leveler in the first electroplating solution is at least 50, or 100,    or 200, or 500.-   Item 11. The method of item 1, wherein forming the first layer    results in the first major surface comprising a plurality of    non-uniformly arranged first structures.-   Item 12. The method of item 11, wherein the first structures    comprise flat facets.-   Item 13. The method of item 11, wherein forming the second layer    results in the second major surface comprising a plurality of    non-uniformly arranged second structures.-   Item 14. The method of item 13, further comprising:    -   forming a third layer of a second metal on the second major        surface by electrodepositing the second metal using an        electroplating solution of the second metal.-   Item 15. The method of item 14, wherein the second metal comprises    chromium.-   Item 16. A microreplication tool made using a method according to    item 1, such that the microreplication tool has a tool structured    surface corresponding to the second major surface.-   Item 17. The microreplication tool of item 16, wherein the tool    structured surface corresponds to an inverted form of the second    major surface or a non-inverted form of the second major surface.-   Item 18. The microreplication tool of item 16, wherein the    microreplication tool includes the first layer of the metal, the    second layer of the metal, and a third layer of a second metal    formed on the second layer.-   Item 19. An optical film made using the microreplication tool of    item 16, such that the film has a structured surface corresponding    to the second major surface.-   Item 20. The optical film of item 19, wherein the structured surface    of the film corresponds to an inverted form of the second major    surface or a non-inverted form of the second major surface.-   Item 21. An optical film, comprising:    -   a structured major surface comprising closely-packed structures        arranged such that ridges are formed between adjacent        structures, the structures being limited in size along two        orthogonal in-plane directions;    -   wherein the structured major surface has a topography        characterizable by a first and second Fourier power spectrum        associated with respective first and second orthogonal in-plane        directions, and wherein        -   to the extent the first Fourier power spectrum includes one            or more first frequency peak not corresponding to zero            frequency and being bounded by two adjacent valleys that            define a first baseline, any such first frequency peak has a            first peak ratio of less than 0.8, the first peak ratio            being equal to an area between the first frequency peak and            the first baseline divided by an area beneath the first            frequency peak; and    -   to the extent the second Fourier power spectrum includes one or        more second frequency peak not corresponding to zero frequency        and being bounded by two adjacent valleys that define a second        baseline, any such second frequency peak has a second peak ratio        of less than 0.8, the second peak ratio being equal to an area        between the second frequency peak and the second baseline        divided by an area beneath the second frequency peak; and    -   wherein the structured major surface is characterized by a total        ridge length per unit area in plan view of less than 200 mm/mm².-   Item 22. The film of item 21, wherein the total ridge length per    unit area is less than 150 mm/mm².-   Item 23. The film of item 22, wherein the total ridge length per    unit area is in a range from 10 to 150 mm/mm².-   Item 24. The film of item 21, wherein the first peak ratio is less    than 0.5 and the second peak ratio is less than 0.5.-   Item 25. The film of item 21, wherein the structured major surface    provides an optical haze of at least 5% and less than 95%.-   Item 26. The film of item 21, wherein the closely-packed structures    are characterized by equivalent circular diameters (ECDs) in plan    view, and wherein the structures have an average ECD of less than 15    microns.-   Item 27. The film of item 26, wherein the structures have an average    ECD of less than 10 microns.-   Item 28. The film of item 26, wherein the structures have an average    ECD in a range from 4 to 10 microns.-   Item 29. The film of item 21, wherein the structured major surface    comprises substantially no beads.-   Item 30. The film of item 21, wherein at least some of the    closely-packed structures comprise curved base surfaces.-   Item 31. The film of item 30, wherein most of the closely-packed    structures comprise curved base surfaces.-   Item 32. The film of item 31, wherein substantially all of the    closely-packed structures comprise curved base surfaces.-   Item 33. An optical film, comprising:    -   a structured major surface comprising closely-packed structures,        the structured major surface defining a reference plane and a        thickness direction perpendicular to the reference plane;    -   wherein the structured major surface has a topography        characterizable by a first and second Fourier power spectrum        associated with respective first and second orthogonal in-plane        directions, and wherein        -   to the extent the first Fourier power spectrum includes one            or more first frequency peak not corresponding to zero            frequency and being bounded by two adjacent valleys that            define a first baseline, any such first frequency peak has a            first peak ratio of less than 0.8, the first peak ratio            being equal to an area between the first frequency peak and            the first baseline divided by an area beneath the first            frequency peak; and        -   to the extent the second Fourier power spectrum includes one            or more second frequency peak not corresponding to zero            frequency and being bounded by two adjacent valleys that            define a second baseline, any such second frequency peak has            a second peak ratio of less than 0.8, the second peak ratio            being equal to an area between the second frequency peak and            the second baseline divided by an area beneath the second            frequency peak;    -   wherein the closely-packed structures are characterized by        equivalent circular diameters (ECDs) in the reference plane and        mean heights along the thickness direction, and wherein an        aspect ratio of each structure equals the mean height of the        structure divided by the ECD of the structure; and    -   wherein an average aspect ratio of the structures is less than        0.15.-   Item 34. The film of item 33, wherein the structured major surface    is characterized by a total ridge length per unit area in plan view    of less than 200 mm/mm².-   Item 35. The film of item 34, wherein the total ridge length per    unit area is less than 150 mm/mm².-   Item 36. The film of item 35, wherein the total ridge length per    unit area is in a range from 10 to 150 mm/mm².-   Item 37. The film of item 33, wherein the first peak ratio is less    than 0.5 and the second peak ratio is less than 0.5.-   Item 38. The film of item 33, wherein the structured major surface    provides an optical haze of at least 5% and less than 95%.-   Item 39. The film of item 33, wherein the closely-packed structures    are characterized by equivalent circular diameters (ECDs) in plan    view, and wherein the structures have an average ECD of less than 15    microns.-   Item 40. The film of item 39, wherein the structures have an average    ECD of less than 10 microns.-   Item 41. The film of item 39, wherein the structures have an average    ECD in a range from 4 to 10 microns.-   Item 42. The film of item 33, wherein the structured major surface    comprises substantially no beads.-   Item 43. The film of item 33, wherein at least some of the    closely-packed structures comprise curved base surfaces.-   Item 44. The film of item 43, wherein most of the closely-packed    structures comprise curved base surfaces.-   Item 45. The film of item 44, wherein substantially all of the    closely-packed structures comprise curved base surfaces.-   Item 46. An optical film, comprising:    -   a structured major surface comprising closely-packed structures        having curved base surfaces;    -   wherein the structured major surface has a topography        characterizable by a first and second Fourier power spectrum        associated with respective first and second orthogonal in-plane        directions, and wherein        -   to the extent the first Fourier power spectrum includes one            or more first frequency peak not corresponding to zero            frequency and being bounded by two adjacent valleys that            define a first baseline, any such first frequency peak has a            first peak ratio of less than 0.8, the first peak ratio            being equal to an area between the first frequency peak and            the first baseline divided by an area beneath the first            frequency peak; and        -   to the extent the second Fourier power spectrum includes one            or more second frequency peak not corresponding to zero            frequency and being bounded by two adjacent valleys that            define a second baseline, any such second frequency peak has            a second peak ratio of less than 0.8, the second peak ratio            being equal to an area between the second frequency peak and            the second baseline divided by an area beneath the second            frequency peak; and    -   wherein the structured major surface provides an optical haze of        less than 95%.-   Item 47. The film of item 46, wherein the structured major surface    provides an optical haze of less than 90%.-   Item 48. The film of item 47, wherein the structured major surface    provides an optical haze of less than 80%.-   Item 49. The film of item 47, wherein the structured major surface    provides an optical haze in a range from 20 to 80%.-   Item 50. The film of item 46, wherein the structured major surface    is characterized by a total ridge length per unit area in plan view    of less than 200 mm/mm².-   Item 51. The film of item 46, wherein the first peak ratio is less    than 0.5 and the second peak ratio is less than 0.5.-   Item 52. The film of item 46, wherein the closely-packed structures    are characterized by equivalent circular diameters (ECDs) in plan    view, and wherein the structures have an average ECD of less than 15    microns.-   Item 53. The film of item 52, wherein the structures have an average    ECD of less than 10 microns.-   Item 54. The film of item 52, wherein the structures have an average    ECD in a range from 4 to 10 microns.-   Item 55. The film of item 46, wherein the structured major surface    comprises substantially no beads.-   Item 56. An optical film, comprising:    -   a structured major surface comprising closely-packed structures;    -   wherein the structured major surface has a topography        characterizable by a first and second Fourier power spectrum        associated with respective first and second orthogonal in-plane        directions, and wherein        -   to the extent the first Fourier power spectrum includes one            or more first frequency peak not corresponding to zero            frequency and being bounded by two adjacent valleys that            define a first baseline, any such first frequency peak has a            first peak ratio of less than 0.8, the first peak ratio            being equal to an area between the first frequency peak and            the first baseline divided by an area beneath the first            frequency peak; and        -   to the extent the second Fourier power spectrum includes one            or more second frequency peak not corresponding to zero            frequency and being bounded by two adjacent valleys that            define a second baseline, any such second frequency peak has            a second peak ratio of less than 0.8, the second peak ratio            being equal to an area between the second frequency peak and            the second baseline divided by an area beneath the second            frequency peak; and    -   wherein the structured major surface provides an optical haze in        a range from 10 to 60% and an optical clarity in a range from 10        to 40%.-   Item 57. The film of item 56, wherein the structured major surface    provides an optical haze in a range from 20 to 60% and an optical    clarity in a range from 10 to 40%.-   Item 58. The film of item 57, wherein the structured major surface    provides an optical haze in a range from 20 to 30% and an optical    clarity in a range from 15 to 40%.-   Item 59. The film of item 56, wherein the structured major surface    is characterized by a total ridge length per unit area in plan view    of less than 200 mm/mm².-   Item 60. The film of item 56, wherein the first peak ratio is less    than 0.5 and the second peak ratio is less than 0.5.-   Item 61. The film of item 56, wherein the closely-packed structures    are characterized by equivalent circular diameters (ECDs) in plan    view, and wherein the structures have an average ECD of less than 15    microns.-   Item 62. The film of item 61, wherein the structures have an average    ECD of less than 10 microns.-   Item 63. The film of item 62, wherein the structures have an average    ECD in a range from 4 to 10 microns.-   Item 64. The film of item 56, wherein the structured major surface    comprises substantially no beads.-   Item 65. An optical film, comprising:    -   a structured major surface comprising larger first structures        and smaller second structures, the first and second structures        both being limited in size along two orthogonal in-plane        directions;    -   wherein the first structures are non-uniformly arranged on the        major surface;    -   wherein the second structures are closely packed and        non-uniformly dispersed between the first structures; and    -   wherein an average size of the first structures is greater than        15 microns and an average size of the second structures is less        than 15 microns.-   Item 66. The film of item 65, wherein the average size of the first    structures is an average equivalent circular diameter (ECD) of the    first structures, and the average size of the second structures is    an average equivalent circular diameter (ECD) of the second    structures.-   Item 67. The film of item 65, wherein the average size of the first    structures is in a range from 20 to 30 microns.-   Item 68. The film of item 65, wherein the average size of the second    structures is in a range from 4 to 10 microns.-   Item 69. The film of item 65, wherein the structured major surface    has a topography characterizable by a first and second Fourier power    spectrum associated with respective first and second orthogonal    in-plane directions, and wherein    -   to the extent the first Fourier power spectrum includes one or        more first frequency peak not corresponding to zero frequency        and being bounded by two adjacent valleys that define a first        baseline, any such first frequency peak has a first peak ratio        of less than 0.8, the first peak ratio being equal to an area        between the first frequency peak and the first baseline divided        by an area beneath the first frequency peak; and    -   to the extent the second Fourier power spectrum includes one or        more second frequency peak not corresponding to zero frequency        and being bounded by two adjacent valleys that define a second        baseline, any such second frequency peak has a second peak ratio        of less than 0.8, the second peak ratio being equal to an area        between the second frequency peak and the second baseline        divided by an area beneath the second frequency peak.-   Item 70. The film of item 69, wherein the first ratio is less than    0.5 and the second ratio is less than 0.5.-   Item 71. The film of item 65, wherein the first structures are    flat-faceted structures, and the second structures are curved    structures.-   Item 72. The film of item 65, wherein the first structures are first    cavities in the major surface, and the second structures are second    cavities in the major surface.-   Item 73. The film of item 65, wherein the structured major surface    is characterized by a bimodal distribution of equivalent circular    diameter (ECD) of structures of the structured surface, the bimodal    distribution having a first and second peak, the larger first    structures corresponding to the first peak and the smaller second    structures corresponding to the second peak.-   Item 74. The film of item 65, wherein the structured major surface    comprises substantially no beads.-   Item 75. An optical film comprising a first structured major surface    opposite a second structured major surface, wherein the first    structured major surface is made by microreplication from a first    tool structured surface, the first tool structured surface being    made by forming a first layer of a metal by electrodepositing the    metal using a first electroplating process resulting in a major    surface of the first layer having a first average roughness, and    forming a second layer of the metal on the major surface of the    first layer by electrodepositing the metal on the first layer using    a second electroplating process resulting in a major surface of the    second layer having a second average roughness smaller than the    first average roughness, the major surface of the second layer    corresponding to the tool structured surface.-   Item 76. The film of item 75, wherein the second structured major    surface is made by microreplication from a second tool structured    surface, the second tool structured surface being made by forming a    third layer of the metal by electrodepositing the metal using a    third electroplating process resulting in a major surface of the    third layer having a third average roughness, and forming a fourth    layer of the metal on the major surface of the third layer by    electrodepositing the metal on the third layer using a fourth    electroplating process resulting in a major surface of the fourth    layer having a fourth average roughness smaller than the third    average roughness, the major surface of the fourth layer    corresponding to the second tool structured surface.-   Item 77. The film of item 76, wherein the first structured major    surface is associated with a first haze and the second structured    major surface is associated with a second haze, and the first haze    is greater than the second haze.-   Item 78. A display system, comprising:    -   a light guide;    -   a display panel configured to be backlit by light from the light        guide;    -   one or more prismatic brightness enhancement films disposed        between the light guide and the display panel; and    -   a light diffusing film disposed between the light guide and the        one or more prismatic brightness enhancement films;    -   wherein the light diffusing film has a haze of at least 80%; and    -   wherein the light diffusing film has a first structured major        surface made by microreplication from a tool structured surface,        the tool structured surface being made by forming a first layer        of a metal by electrodepositing the metal using a first        electroplating process resulting in a major surface of the first        layer having a first average roughness, and forming a second        layer of the metal on the major surface of the first layer by        electrodepositing the metal on the first layer using a second        electroplating process resulting in a major surface of the        second layer having a second average roughness smaller than the        first average roughness, the major surface of the second layer        corresponding to the tool structured surface.-   Item 79. The display system of item 78, wherein the first structured    major surface of the light diffusing film has a topography    characterizable by a first and second Fourier power spectrum    associated with respective first and second orthogonal in-plane    directions, and wherein    -   to the extent the first Fourier power spectrum includes one or        more first frequency peak not corresponding to zero frequency        and being bounded by two adjacent valleys that define a first        baseline, any such first frequency peak has a first peak ratio        of less than 0.8, the first peak ratio being equal to an area        between the first frequency peak and the first baseline divided        by an area beneath the first frequency peak; and    -   to the extent the second Fourier power spectrum includes one or        more second frequency peak not corresponding to zero frequency        and being bounded by two adjacent valleys that define a second        baseline, any such second frequency peak has a second peak ratio        of less than 0.8, the second peak ratio being equal to an area        between the second frequency peak and the second baseline        divided by an area beneath the second frequency peak.-   Item 80. The display system of item 79, and    -   wherein the first structured major surface of the light        diffusing film comprises closely-packed structures arranged such        that ridges are formed between adjacent structures, the        structures being limited in size along two orthogonal in-plane        directions;    -   wherein the first structured major surface is characterized by a        total ridge length per unit area in plan view of less than 200        mm/mm².-   Item 81. The display system of item 79, and    -   wherein the first structured major surface of the light        diffusing film comprises closely-packed structures, the        structured major surface defining a reference plane and a        thickness direction perpendicular to the reference plane;    -   wherein the closely-packed structures are characterized by        equivalent circular diameters (ECDs) in the reference plane and        mean heights along the thickness direction, and wherein an        aspect ratio of each structure equals the mean height of the        structure divided by the ECD of the structure; and    -   wherein an average aspect ratio of the structures is less than        0.15.-   Item 82. The display system of item 79, and    -   wherein the first structured major surface of the light        diffusing film comprises closely-packed structures having curved        base surfaces; and    -   wherein the first structured major surface provides an optical        haze of less than 95%.-   Item 83. The display system of item 78, wherein the first structured    major surface of the light diffusing film comprises larger first    structures and smaller second structures, the first and second    structures both being limited in size along two orthogonal in-plane    directions; and    -   wherein the first structures are non-uniformly arranged on the        first structured major surface;    -   wherein the second structures are closely packed and        non-uniformly dispersed between the first structures; and    -   wherein an average size of the first structures is greater than        15 microns and an average size of the second structures is less        than 15 microns.-   Item 84. The display system of item 78, wherein the light diffusing    film has a second structured major surface opposite the first    structured major surface, the second structured major surface made    by microreplication from a second tool structured surface, the    second tool structured surface being made by forming a third layer    of the metal by electrodepositing the metal using a third    electroplating process resulting in a major surface of the third    layer having a third average roughness, and forming a fourth layer    of the metal on the major surface of the third layer by    electrodepositing the metal on the third layer using a fourth    electroplating process resulting in a major surface of the fourth    layer having a fourth average roughness smaller than the third    average roughness, the major surface of the fourth layer    corresponding to the second tool structured surface.-   Item 85. The system of item 84, wherein the first structured major    surface of the diffusing film faces the display panel and the second    structured major surface of the diffusing film faces the light    guide, and wherein the first structured major surface is associated    with a first haze and the second structured major surface is    associated with a second haze, and the first haze is greater than    the second haze.-   Item 86. A display system, comprising:    -   a light guide;    -   a display panel configured to be backlit by light from the light        guide;    -   a light diffusing film disposed in front of the display system        such that the display panel is between the light guide and the        light diffusing film;    -   wherein the light diffusing film has a haze in a range from        10-30%; and    -   wherein the light diffusing film has a first structured major        surface made by microreplication from a tool structured surface,        the tool structured surface being made by forming a first layer        of a metal by electrodepositing the metal using a first        electroplating process resulting in a major surface of the first        layer having a first average roughness, and forming a second        layer of the metal on the major surface of the first layer by        electrodepositing the metal on the first layer using a second        electroplating process resulting in a major surface of the        second layer having a second average roughness smaller than the        first average roughness, the major surface of the second layer        corresponding to the tool structured surface.-   Item 87. The display system of item 86, wherein the first structured    major surface of the light diffusing film has a topography    characterizable by a first and second Fourier power spectrum    associated with respective first and second orthogonal in-plane    directions, and wherein    -   to the extent the first Fourier power spectrum includes one or        more first frequency peak not corresponding to zero frequency        and being bounded by two adjacent valleys that define a first        baseline, any such first frequency peak has a first peak ratio        of less than 0.8, the first peak ratio being equal to an area        between the first frequency peak and the first baseline divided        by an area beneath the first frequency peak; and    -   to the extent the second Fourier power spectrum includes one or        more second frequency peak not corresponding to zero frequency        and being bounded by two adjacent valleys that define a second        baseline, any such second frequency peak has a second peak ratio        of less than 0.8, the second peak ratio being equal to an area        between the second frequency peak and the second baseline        divided by an area beneath the second frequency peak.-   Item 88. The display system of item 87, and    -   wherein the first structured major surface of the light        diffusing film comprises closely-packed structures arranged such        that ridges are formed between adjacent structures, the        structures being limited in size along two orthogonal in-plane        directions;    -   wherein the first structured major surface is characterized by a        total ridge length per unit area in plan view of less than 200        mm/mm².-   Item 89. The display system of item 87, wherein the first structured    major surface comprises closely-packed structures, and wherein the    structured major surface provides an optical clarity in a range from    10 to 40%.-   Item 90. The display system of item 86, wherein the first structured    major surface faces the front of the display system.-   Item 91. The display system of item 90, wherein the first structured    major surface is a front-most surface of the display system.

Various modifications and alterations of this invention will be apparentto those skilled in the art without departing from the spirit and scopeof this invention, and it should be understood that this invention isnot limited to the illustrative embodiments set forth herein. Forexample, the disclosed transparent conductive articles may also includean anti-reflective coating and/or a protective hard coat. The readershould assume that features of one disclosed embodiment can also beapplied to all other disclosed embodiments unless otherwise indicated.It should also be understood that all U.S. patents, patent applicationpublications, and other patent and non-patent documents referred toherein are incorporated by reference, to the extent they do notcontradict the foregoing disclosure.

1. An optical film, comprising: a structured major surface comprisingclosely-packed structures arranged such that ridges are formed betweenadjacent structures, the structures being limited in size along twoorthogonal in-plane directions; wherein the structured major surface hasa topography characterizable by a first and second Fourier powerspectrum associated with respective first and second orthogonal in-planedirections, and wherein to the extent the first Fourier power spectrumincludes one or more first frequency peak not corresponding to zerofrequency and being bounded by two adjacent valleys that define a firstbaseline, any such first frequency peak has a first peak ratio of lessthan 0.8, the first peak ratio being equal to an area between the firstfrequency peak and the first baseline divided by an area beneath thefirst frequency peak; and to the extent the second Fourier powerspectrum includes one or more second frequency peak not corresponding tozero frequency and being bounded by two adjacent valleys that define asecond baseline, any such second frequency peak has a second peak ratioof less than 0.8, the second peak ratio being equal to an area betweenthe second frequency peak and the second baseline divided by an areabeneath the second frequency peak; and wherein the structured majorsurface is characterized by a total ridge length per unit area in planview of less than 200 mm/mm².
 2. The film of claim 1, wherein thestructured major surface comprises substantially no beads.
 3. An opticalfilm, comprising: a structured major surface comprising closely-packedstructures having curved base surfaces; wherein the structured majorsurface has a topography characterizable by a first and second Fourierpower spectrum associated with respective first and second orthogonalin-plane directions, and wherein to the extent the first Fourier powerspectrum includes one or more first frequency peak not corresponding tozero frequency and being bounded by two adjacent valleys that define afirst baseline, any such first frequency peak has a first peak ratio ofless than 0.8, the first peak ratio being equal to an area between thefirst frequency peak and the first baseline divided by an area beneaththe first frequency peak; and to the extent the second Fourier powerspectrum includes one or more second frequency peak not corresponding tozero frequency and being bounded by two adjacent valleys that define asecond baseline, any such second frequency peak has a second peak ratioof less than 0.8, the second peak ratio being equal to an area betweenthe second frequency peak and the second baseline divided by an areabeneath the second frequency peak; and wherein the structured majorsurface provides an optical haze of less than 95%.
 4. An optical film,comprising: a structured major surface comprising closely-packedstructures; wherein the structured major surface has a topographycharacterizable by a first and second Fourier power spectrum associatedwith respective first and second orthogonal in-plane directions, andwherein to the extent the first Fourier power spectrum includes one ormore first frequency peak not corresponding to zero frequency and beingbounded by two adjacent valleys that define a first baseline, any suchfirst frequency peak has a first peak ratio of less than 0.8, the firstpeak ratio being equal to an area between the first frequency peak andthe first baseline divided by an area beneath the first frequency peak;and to the extent the second Fourier power spectrum includes one or moresecond frequency peak not corresponding to zero frequency and beingbounded by two adjacent valleys that define a second baseline, any suchsecond frequency peak has a second peak ratio of less than 0.8, thesecond peak ratio being equal to an area between the second frequencypeak and the second baseline divided by an area beneath the secondfrequency peak; and wherein the structured major surface provides anoptical haze in a range from 10 to 60% and an optical clarity in a rangefrom 10 to 40%.